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延庆─怀来地区地壳细结构──利用深地震反射剖面
引用本文:张先康,王椿镛.延庆─怀来地区地壳细结构──利用深地震反射剖面[J].地球物理学报,1996,39(3):356-364.
作者姓名:张先康  王椿镛
作者单位:1. 国家地震局地球物理勘探中心,郑州450003; 2. 国家地震局地球物理研究所,北京100081; 3. 国家地震局地质研究所,北京100029; 4. 国家地震局震害防御司,北京100036
基金项目:国家科委“八五”科技重点项目
摘    要:1992年底在延庆-怀来地区实施了深地震反射剖面测量,目的是通过对该区地壳细结构的研究来探讨延庆-怀来盆地形成演化的机制和过程,以及与该区地震活动图像的关系.结果表明,研究区上部地壳总体上呈“透明”性质,厚25-26km;下部地壳具有强烈的反射性质,厚约14-15km.壳幔过渡带是由双程走时约2s和厚约5-6km的水平反射叠层所组成,莫霍界面具有深度深(约39-40km)和平坦的特点。

关 键 词:延庆─怀来盆地  深地震反射  地壳细结构  
收稿时间:1995-07-17

FINE CRUSTAL STRUCTURE IN YANQING─HUAILAI REGION BY DEEP SEISMIC REFLECTION PROFILING
ZHANG XIAN-KANG,WANG CHUN-YONG,LIU GUO-DONG,SONG JIAN-LI,LUO LI-LEI,WU TAO,WU JIAN-CHUN.FINE CRUSTAL STRUCTURE IN YANQING─HUAILAI REGION BY DEEP SEISMIC REFLECTION PROFILING[J].Chinese Journal of Geophysics,1996,39(3):356-364.
Authors:ZHANG XIAN-KANG  WANG CHUN-YONG  LIU GUO-DONG  SONG JIAN-LI  LUO LI-LEI  WU TAO  WU JIAN-CHUN
Affiliation:1. Research Center of Exploration Geophysics, SSB, Zhengxhou 450003, China; 2. Institute of Geophysics, SSB, Beijing 100081, China; 3. Institute of Geology, SS B, Beijing 100029, China; 4. Department of Seismic Haxard Prevention, SSB, Beijing 100036, China
Abstract:At the end of 1992, deep seismic reflection measurements were carried out in Yanqing-Huailai region by Research Center of Exploration Geophysics and Institute of Geophysics of State Seismalogical Bureau.The object of this experiment is to investigate the evolution mechanism and process of Yanqing-Huailai basin and its relation to the seismicity in this region.The results indicate that the upper crust is characterized by seismic transparency with the thickness of about 25-26km and the lower crust is characterized by high reflectivity with the thickness of about 14-15km in this region.The crust-mantle transition zone consists of sets of subhorizontal reflections refferred to seismic lamellae with TWT of 2 seconds and the thickness of about 5- 6km. The Moho is flat and its depth is about 39-40km in this region.
Keywords:Yanqing-Huailai basin  Deep seismic reflection profiling  Fine crustal structure
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