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1.
Fifty-two trace elements in NIST SRM 614, 616 and MPI-DING BM90/21-G glass reference materials as well as in NIST SRM 612, USGS BCR2-G and other MPI-DING reference glasses (KL2-G, GOR132-G, GOR128-G, ATHO-G, Tl-G, StHs6/80-G and ML3B-G) were determined by laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS). Accurate ultra-low trace element abundances in the NIST SRM 614, 616 and BM90/21-G reference glasses down to lower ng g−1 levels were determined with relative standard deviations (RSD) of less than 10%. Limits of detection using He as carrier gas were up to two times lower than with Ar and were 0.004 to 0.12 μg g−1 for elements of lower mass numbers (amu < 85) and 0.002 to 0.06 μg g−1 for elements having amu < 85. The measured concentrations generally agree within 15% with previous studies except for B in NIST SRM 614 and 616, which appears to be heterogeneously distributed, and Co, Zn, Ga and Ag in NIST SRM 616 for which the existing data set is too small to evaluate the discrepancies. New values for As (0.593 μg g−1), Ag (0.361 μg g−1) and Cd (0.566 μg g−1) in NIST SRM 614 and new values for Na (94864 μg g−1) and As (0.276 μg g−1) in NIST SRM 616 are reported.  相似文献   

2.
Fifty elements in NIST SRM 614 and 616 glass reference materials were determined by laser ablation microprobe-inductively coupled plasma-mass spectrometry (LAM-ICP-MS). The values determined for NIST SRM 614 agreed well with the NIST-certified and information values (mean relative difference ± 3.6%), except for B, Sc and Sb. The values determined for NIST SRM 616 agreed with the NIST-certified and information values within a mean relative difference of ± 1.5%, except for B, Sc and Ga. In addition, at an 80 μm sampling scale, NIST SRM 614 and 616 glass discs were homogeneous for trace elements within the observed precisions of 5 and 15% (mean), respectively. Detection limits were in the range 0.01 - 0.3 μg g−1 for elements of lower mass numbers (amu < 80) and 1 - 10 ng g−1 for heavy elements (amu > 80). Detection at the sub ng g−1 level is possible for most of the heavy elements by using an ablation pit size larger than 10 0 μm.  相似文献   

3.
The microanalytical capability of laser ablation microprobe-inductively coupled plasma-mass spectrometry (LAM-ICP-MS) to determine ultra trace elemental concentrations has been demonstrated by the analysis of two low concentration glass standard reference materials, NIST SRM 614 and 616. Results for fifty two elements at concentrations in the low ng g-1 range are compared with those determined using secondary ion mass spectrometry (SIMS). Both techniques provide results at these concentrations that generally agree within 95% confidence limits, demonstrating the accuracy for ultra-trace level of in situ determinations by the two techniques. At concentrations of less than 20 ng g-1 in NIST SRM 616, an accuracy and precision of better than 10% has been obtained for most mono-isotopic rare earth elements, when a spot size of 50 μm is used. Limits of detection for selected elements were as low as 0.5 ng g-1.  相似文献   

4.
A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g−1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g−1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g−1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g−1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g−1.  相似文献   

5.
The analytical capabilities of laser ablation (LA)-ICP-MS in determining Li, Be and B at trace levels in geological samples have been tested on a series of glass reference materials and natural samples. The LA-ICP-MS instrument used consisted of a sector-field ICP-MS coupled with a laser ablation microprobe operating at either 266 or 213 nm wavelength. Reference glasses from NIST (SRM 612, 614 and 616) and MPI-DING (KL2-G, ML3B-G, StHs6/80-G, GOR128-G, GOR132-G, T1-G and ATHO-G) were selected to develop the analytical method and to assess the best instrumental configuration. A series of calcic amphiboles with different Li, Be and B concentrations were also analysed using both LA-ICP-MS and SIMS to test the applicability of the method to natural minerals. Results indicated that with a spot size of 40 μm the agreement between measured and reference values of Li, Be and B is generally better than 10% for NIST SRM 612 and 20% for NIST SRM 614. Average reproducibility at the 2s level was 10% for Li, 20% for Be and 15% for B. Limits of detection were approximately 100 ng g-1 for Be and B and 200 ng g-1 for Li. These results were confirmed by analyses carried out on natural amphiboles and compared well in terms of precision and accuracy with those commonly achieved by SIMS.  相似文献   

6.
A new technique for the in situ analysis of Re, Au, Pd, Pt and Rh in natural basalt glass by laser ablation (LA)-ICP-MS is described. The method involves external calibration against NIST SRM 612/613 or 614/615 glass certified reference materials, internal standardisation using Ca, and ablation with a 200 μm wide beam spot and a pulsed laser repetition rate of 50 Hz. Under these conditions, sensitivities for Re, Au, Pd, Pt and Rh analyte ions are ˜ 5000 to 100,000 cps/μg g-1. This is sufficient to make measurements precise to ˜ 10% at the 2-10 μg g-1 level, which is well within the range of concentrations expected in many basalts. For LA-ICP-MS calibration and a demonstration of the accuracy of the technique, concentrations of Re, Au, Pd, Pt and Rh in the NIST SRM 610/611 (˜ 1 to 50 μg g-1), 612/613 (˜ 1 to 7 μg g-1), 614/615 (˜ 0.2 to 2 μg g-1) and 616/617 (˜ 0.004 to 2 μg g-1) glasses were determined by solution-nebulisation (SN)-ICP-MS. Using the 612/613 or 614/615 glasses as calibration standards, LA-ICP-MS measurements of these elements in the other NIST glasses fell within ˜ 15% of those determined by SN-ICP-MS. Replicate LA-ICP-MS analyses of the 612/613 and 614/615 glasses indicate that, apart from certain anomalous domains, the glasses are homogeneous for Re, Au, Pd, Pt and Rh to better than 3.5%. Two LA-ICP-MS analyses of natural, island-arc basalt glasses exhibit large fractionations of Re, Au and Pd relative to Pt and Rh, compared to the relative abundances in the primitive mantle.  相似文献   

7.
We report new data on the trace element concentrations of Mg, Cr, Mn, Co, Ni, Cu, Zn, Sr, Cd, Ba, La, Ce, Nd, Pb and U in USGS carbonate reference materials (MACS-1 and MACS-2) and compare solution ICP-MS and LA-ICP-MS trace element determinations on landfill calcites using calibration to different reference materials (MACS-1 and MACS-2 carbonate and NIST SRM 612 glass). Very good agreement (differences below 10% relative) was found between laser ablation and solution ICP-MS data for MACS-1 with higher concentrations of trace elements (values between 100 and 150 μg g−1), with the exception of Cu and Zn. Similarly good agreement was found for MACS-2 with lower trace element concentrations (units to tens of μg g−1), with the exception of Cr, Co and Zn. The MACS-1 reference material for calibration of LA-ICP-MS was found to be extremely useful for in situ determination of trace elements in real-world carbonate samples (landfill calcites), especially those present in calcite in higher concentrations (Mn, Sr, Ba; < 5% RSD). Less accurate determinations were generally obtained for trace elements present at low concentrations (∼ units of μg g−1). In addition, good agreement was observed between the instrument calibration to MACS and NIST SRM 612 glass for in situ measurements of trace elements in landfill calcites K-2, K-3 and K-4 (differences below 15% relative for most elements). Thus, the application of MACS carbonate reference materials is promising and points to the need for the development of new carbonate reference materials for laser ablation ICP-MS.  相似文献   

8.
The concentrations of fifty trace elements, including relatively volatile elements and transition metal elements, in fused glasses of Geological Survey of Japan rock reference materials GSJ JR-2, JA-1, JA-2, JB-1a, JB-3, JGb-1 and JF-1 were determined by particle (proton) induced X-ray emission (PIXE) and laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS). The fused glasses were prepared by rapid fusion and subsequent quenching in welded platinum capsules and were found to be homogeneous for major elements and for trace elements with concentrations of more than 1 μg g-1 within the observed precision (± 10% mean) on a 70 μm sampling scale. The values obtained by PIXE and LA-ICP-MS for the transition elements (Cr, Mn, Fe, Ni and Cu), the relatively volatile elements (Zn, Ga, Rb and Pb) and the refractory elements (Y, Zr, Nb and Th) with concentrations greater than a few μg g-1 showed good agreement (within 10 % relative difference). The values for almost all the elements detected at concentrations higher than 1 μg g-1 as determined by LA-ICP-MS also agreed well with the reference values (mean relative difference < ± 10%), except for B and Cu. The good agreement confirmed the appropriateness of the NIST SRM 600 series glass calibration reference material for LA-ICP-MS analysis of glasses with variable major-element compositions for almost all elements. The concentrations of Cu in all the samples were lower than the reference values, which was attributed to adsorption of the transition metals onto the platinum capsule during preparation.  相似文献   

9.
Microanalytical trace element techniques (such as ion probe or laser ablation ICP-MS) are hampered by a lack of well characterized, homogeneous standards. Two silicate glass reference materials produced by National Institute of Standards and Technology (NIST), NIST SRM 610 and NIST SRM 612, have been shown to be homogeneous and are spiked with up to sixty one trace elements at nominal concentrations of 500 μg g-1 and 50 μg g-1 respectively. These samples (supplied as 3 mm wafers) are equivalent to NIST SRM 611 and NIST SRM 613 respectively (which are supplied as 1 mm wafers) and are becoming more widely used as potential microanalytical reference materials. NIST however, only certifies up to eight elements in these glasses. Here we have compiled concentration data from approximately sixty published works for both glasses, and have produced new analyses from our laboratories. Compilations are presented for the matrix composition of these glasses and for fifty eight trace elements. The trace element data includes all available new and published data, and summaries present the overall average and standard deviation, the range, median, geometric mean and a preferred average (which excludes all data outside ± one standard deviation of the overall average). For the elements which have been certified, there is a good agreement between the compiled averages and the NIST data. This compilation is designed to provide useful new working values for these reference materials.  相似文献   

10.
This paper describes a technique for the preparation of a titanite (CaTiSiO5) glass calibration material for use in in situ microanalysis of major, minor, and trace elements in geological materials. The starting composition was a titanite matrix doped with minor and trace elements at ∼ 200 μg g-1. The elements Sc, Y, REEs, Th and U were added in the form of nitrates in solution, and the elements V, Cr, Mn, Fe, Co, Ni, Zr, Nb, Hf and W were added as solid oxides. The synthetic titanite glass was produced by direct fusion by resistance heating in graphite electrodes at 1600-1700 °C, and quenched in air. Backscattered electron images indicate good homogeneity, with no signs of separate phases or vesicles, and analysis of the major elements Ca, Ti and Si by electron microprobe showed relative standard deviations between 0.5 and 0.7%, based on six independent measurements. Deviations from nominal concentrations for Ca, Si and Ti were measured to -1.2, -3.3 and -0.8%, respectively. The homogeneity of the trace elements in the glass was assessed by LA-ICP-MS analyses, using NIST SRM 610, 612 and 616 as external calibrators, and Ca as the internal standard element. Determinations were made both with a quadrupole mass spectrometer and a sector field instrument, and both raster and spot modes of analysis were used. For the majority of doped elements, precision was better than 10%, and relative deviations from nominal values were, with few exceptions, between 5 and 10%.  相似文献   

11.
In the past, there has been little interest in the trace element characteristics of quartz, and in consequence little activity in the trace element characteristics of reference materials with high silicon content. The main purpose of this paper is to contribute to the characterisation of two international certified reference materials, BCS 313/1 from the Bureau of Analysed Samples, (BAS), UK and SRM 1830 from the National Institute of Standards and Technology (NIST), USA. BCS 313/1 was analysed by laser ablation inductively coupled plasma-mass spectrometry (LA-ICP-MS), solution ICP-MS and instrumental neutron activation analysis (INAA). NIST SRM 1830 was analysed by LA-ICP-MS and INAA. Analytical results are reported for more than forty elements, most of them for the first time. For most elements, the results obtained by the different methods agree within 15 % relative. The recent, heightened interest in quartz and in particular the precise determination of trace0element contents in natural quartz samples requires the use of well characterised reference materials such as BCS 313/1 and SRM 1830, to which this study is designed to contribute.  相似文献   

12.
A method for the simultaneous determination of Cd with In, Tl and Bi by isotope dilution‐internal standardisation (ID‐IS) ICP‐QMS using the same aliquot for rare earth element and other trace element determinations was developed. Samples mixed with an enriched 149Sm spike were decomposed using a HF‐HClO4 mixture, which was evaporated and then diluted with HNO3. After determination of Sm by ID‐ICP‐QMS and Cd, In, Tl and Bi concentrations were determined using the 149Sm intensity as an internal standard. The interference of MoO+ on Cd+ was corrected using the MoO+/Mo+ ratio separately measured using a Mo standard solution, and the validity of the externally determined oxide‐forming ratio correction was evaluated. The MoO+/Mo+ ratios measured using the standard solution and samples were ～ 0.0002 and < 0.002, respectively. Detection limits for Cd, In, Tl and Bi in silicate samples were at levels of < 1 ng g?1 with a total uncertainty of < 7%. Cadmium in the carbonaceous chondrites, Orgueil (CI1), Murchison (CM2) and Allende (CV3) as well as Cd, In, Tl and Bi in the reference materials, JB‐2, JB‐3, JA‐1, JA‐2, JA‐3, JP‐1 (GSJ), BHVO‐1, AGV‐1, PCC‐1 and DTS‐1 (USGS) and NIST SRM 610, 612, 614 and 616 were determined to show the applicability of this method.  相似文献   

13.
Forty two major (Na, Mg, Ti and Mn) and trace elements covering the mass range from Li to U in three USGS basalt glass reference materials BCR‐2G, BHVO‐2G and BIR‐1G were determined using laser ablation‐inductively coupled plasma‐mass spectrometry. Calibration was performed using NIST SRM 610 in conjunction with internal standardisation using Ca. Determinations were also made on NIST SRM 612 and 614 as well as NIST SRM 610 as unknown samples, and included forty five major (Al and Na) and trace elements. Relative standard deviation (RSD) of determinations was below 10% for most elements in all the glasses under investigation. Consistent exceptions were Sn and Sb in BCR‐2G, BHVO‐2G and BIR‐1G. For BCR‐2G, BHVO‐2G and BIR‐1G, clear negative correlations on a logarithmic scale exist between RSD and concentration for elements lower than 1500 μg g‐1 with logarithmic correlation coefficients between ‐0.75 and ‐0.86. There is also a clear trend of increasing RSD with decreasing concentration from NIST SRM 610 through SRM 612 to SRM 614. These suggest that the difference in the scatter of apparent element concentrations is not due to chemical heterogeneity but reflects analytical uncertainty. It is concluded that all these glasses are, overall, homogeneous on a scale of 60 μm. Our first results on BHVO‐2G and BIR‐1G showed that they generally agreed with BHVO‐2/BHVO‐1 and BIR‐1 within 10% relative. Exceptions were Nb, Ta and Pb in BHVO‐2G, which were 14‐45% lower than reference values for BHVO‐2 and BHVO‐1. Be, Ni, Zn, Y, Zr, Nb, Sn, Sb, Gd, Tb, Er, Pb and U in BIR‐1G were also exceptions. However, of these elements, Be, Nb, Sn, Sb, Gd, Tb, Pb and U gave results that were consistent within an uncertainty of 2s between our data and BIR‐1 reference values. Results on NIST SRM 612 agreed well with published data, except for Mg and Sn. This was also true for elements with m/z 85 (Rb) in the case of NIST SRM 614. The good agreement between measured and reference values for Na and Mg in BCR‐2G, BHVO‐2G and BIR‐1G, and for Al and Na in NIST SRM 610, 612 and 614 up to concentrations of at least several weight percent (which were possible to analyse due to the dynamic range of 108) indicates the suitability of this technique for major, minor and trace element determinations.  相似文献   

14.
激光剥蚀电感耦合等离子体质谱测定岩石样品中稀土元素   总被引：10，自引：0，他引：10  
罗彦  刘勇胜  胡圣虹  高山 《地球科学》2001,26(5):508-512
以NIST612玻璃标准为外标校正物质, 采用42Ca为内标校正灵敏度漂移、基体效应、剥蚀效率及进样量的变化.将LSX-2 0 0激光剥蚀进样系统与POEMSIII电感耦合等离子体质谱仪联用, 对国际标准物质BCR-2 (玄武岩) 及国内标准物质GSR-11 (花岗岩) 玻璃熔饼进行了稀土元素的测定, 建立了LA -ICP -MS整体分析岩石样品中稀土元素的方法.结果表明, 绝大多数稀土元素准确度优于15 %, 测定精度(RSD) 小于10 %.稀土元素的检出限(LOD) 在21.4×10-9~23 1.6×10-9之间, 样品分析速度为2 0样品/h.在Excel软件下用VBA语言编制宏, 实现了脱机数据处理的自动化, 极大提高了工作效率.   相似文献   

15.
ＩＮＴＲＯＤＵＣＴＩＯＮＬａｓｅｒａｂｌａｔｉｏｎｉｎｄｕｃｔｉｖｅｌｙｃｏｕｐｌｅｄｐｌａｓｍａｍａｓｓｓｐｅｃｔｒｏｍｅ ｔｒｙｉｓａｎｉｎｃｒｅａｓｉｎｇｌｙｄｅｖｅｌｏｐｅｄａｎａｌｙｔｉｃａｌｔｅｃｈｎｉｑｕｅｆｏｒｓｏｌｉｄｓａｍｐｌｅａｎａｌｙｓｉｓ.ＬＡ ＩＣＰ ＭＳｏｆｆｅｒｓａｔｔｒａｃｔｉｖｅｃｈａｒａｃｔｅｒｉｓｔｉｃｓｏｆｈｉｇｈｓｅｎｓｉｔｉｖｉｔｙ ,ｌｏｗｄｅｔｅｃｔｉｏｎｌｉｍｉｔｓ,ｍｉｎｉｍａｌｓａｍｐｌｅｐｒｅｐａｒａ ｔｉｏｎ ,ｌｅｓｓｏｘｉｄｅｓｉｎｔｅｒｆｅ…  相似文献   

16.
An efficient, clean procedure for the measurement of element mass fractions in bulk rock nanoparticulate pressed powder pellets (PPPs) by 193 nm laser ablation ICP‐MS is presented. Samples were pulverised by wet milling and pelletised with microcrystalline cellulose as a binder, allowing non‐cohesive materials such as quartz or ceramics to be processed. The LA‐ICP‐MS PPP analytical procedure was optimised and evaluated using six different geological reference materials (JP‐1, UB‐N, BCR‐2, GSP‐2, OKUM and MUH‐1), with rigorous procedural blank quantification employing synthetic quartz. Measurement trueness of the procedure was equivalent to that achieved by solution ICP‐MS and LA‐ICP‐MS analysis of glass. The measurement repeatability was as low as 0.5–2% (1s, n = 6) and, accordingly, PPP homogeneity could be demonstrated. Calibration based on the reference glasses NIST SRM 610, NIST SRM 612, BCR‐2G and GSD‐1G revealed matrix effects for glass and PPP measurement with NIST SRM 61×; using basalt glasses eliminated this problem. Most significantly, trace elements not commonly measured (flux elements Li, B; chalcophile elements As, Sb, Tl, In, Bi) could be quantified. The PPP‐LA‐ICP‐MS method overcomes common problems and limitations in analytical geochemistry and thus represents an efficient and accurate alternative for bulk rock analysis.  相似文献   

17.
We present data on the concentration, the isotope composition and the homogeneity of boron in NIST silicate glass reference materials SRM 610 and SRM 612, and in powders and glasses of geological reference materials JB-2 (basalt) and JR-2 (rhyolite). Our data are intended to serve as references for both microanalytical and wet-chemical techniques. The δ11 B compositions determined by N-TIMS and P-TIMS agree within 0.5% and compare with SIMS data within 2.5%. SIMS profiles demonstrate boron isotope homogeneity to better than δ11 B = 2% for both NIST glasses, however a slight boron depletion was detected towards the outermost 200 μm of the rim of each sample wafer. The boron isotope compositions of SRM 610 and SRM 612 were indistinguishable. Glasses produced in this study by fusing JB-2 and JR-2 powder also showed good boron isotope homogeneity, both within and between different glass fragments. Their major element abundance as well as boron isotope compositions and concentrations were identical to those of the starting composition. Hence, reference materials (glasses) for the in situ measurement of boron isotopes can be produced from already well-studied volcanic samples without significant isotope fractionation. Oxygen isotope ratios, both within and between wafers, of NIST reference glasses SRM 610 and SRM 612 are uniform. In contrast to boron, significant differences in oxygen isotope compositions were found between the two glasses, which may be due to the different amounts of trace element oxides added at ten-fold different concentration levels to the silicate matrix.  相似文献   

18.
Laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) is used to compare the suitability of four cassiterite (SnO2) materials (SPG, Yankee, AY-4 and Jian-1), and three matrix-mismatched reference materials (NIST SRM 612, NIST SRM 614 and 91500 zircon) for normalisation of U-Pb and Pb-Pb isotope ratios in cassiterite. The excess variance of ages determined by LA-ICP-MS is estimated to be ±0.33% for 207Pb/206Pb vs. 208Pb/206Pb isochron ages and ± 1.8% and for U-Pb ages. Incorporation of this excess variance in cassiterite ages is necessary for realistic uncertainties. 207Pb-206Pb ages are advantageous for dating Precambrian cassiterite such as SPG compared with U-Pb ages as matrix effect on instrumental mass fractionation of Pb isotopes are generally considered to be minor. We note minor bias in 207Pb/206Pb vs. 208Pb/206Pb isochron ages (~ 0.6%) when using either the NIST SRM 614 or 91500 zircon reference materials and emphasise the requirement for uncertainty propagation of all sources of error and reference materials with comparable U and Pb mass fraction to the cassiterite. The 238U/206Pb isotopic ratios from normalisation to matrix-mismatched reference materials show varied results, which emphasises the need to use matrix-matched reference materials for calculating U-Pb ages. When cross-calibrated against each other, LA-ICP-MS U-Pb ages of the ca. 1535 Ma SPG, ca. 245 Ma Yankee and ca. 155 Ma Jian-1 cassiterites are all consistent with their ID-TIMS values.  相似文献   

19.
The aim of this study was to improve the quality of laser ablation inductively coupled plasma‐mass spectrometry (LA‐ICP‐MS) determination of phosphorus in crystalline quartz. Over the last decade, the Geological Survey of Norway has routinely performed trace element determinations on quartz from both operating and potential quartz deposits by LA‐ICP‐MS. The determined phosphorus concentrations were, with but few exceptions, consistently within the range of 10 to 30 μg g?1, results that seemed to be both too high and too consistent. The multi‐material calibration curve obtained from a suite of reference materials (NIST SRM 610, 612, 614, 1830, BAM No. 1 amorphous SiO2 glass) did not define a precise regression line. Published phosphorus concentrations for the reference materials are poorly constrained and the observed dispersions along the multi‐material calibration curve suggest that some of the reference values may be inaccurate. Furthermore, the calibration curve did not pass through the origin of the [(cps 31P/cps 30Si) · cone. Si] vs. P concentration diagram; thus, in addition to the uncertainties of the literature values of phosphorus, it is difficult to define the calibration curve. Three reference materials (NIST SRM 614, 1830, synthetic quartz KORTH) were sent for phosphorus accelerator implantation, providing an independent and accurate (± 3%) approach for determining phosphorus concentrations in crystalline quartz. The intrinsic phosphorus concentrations of the three implanted samples plus those for NIST SRM 610 and 612 were determined by secondary ion mass spectrometry (SIMS), yielding new phosphorus values for NIST SRM 610, 612, 614 and 1830. Using these new values resulted in a better defined LA‐ICP‐MS calibration curve. However, the source of the ICP‐MS related background could not be defined, such that it must still be empirically corrected for.  相似文献   

20.
Extensive compositional heterogeneity is shown to affect at least twenty four of the doped trace elements in the NIST SRM 610-617 glasses.
Compositional profiling and mapping using laser ablation ICP-MS reveals that all NIST SRM 610-617 wafers examined here contain domains that are significantly depleted in Ag, As, Au, B, Bi, Cd, Cr, Cs, Mo, Pb, Re, (Rh), Sb, Se, Te, Tl and W, and antithetically enriched in Cu (and Pt), with large enrichments in Cd, Fe and Mn also being encountered in some cases. These domains are visible in doubly polished wafers by unaided visual inspection and by transmitted light and schlieren microscopy. They occur in close proximity to the wafer perimeters and also as stretched and complexly folded forms within wafer interiors. The chemical and optical properties of these heterogeneous domains are consistent with those of compositional cords, a phenomenon of glass manufacture where glass bulk composition and physical properties are modified by loss of volatile components from the molten glass surface. The NIST SRM 610-617 glasses may be considered reliable reference materials for microanalysis of only between one half and two thirds of the trace elements with which they were doped, including Be, Mg, Sr, Ba, Sc, Y, REE, V, Zr, Hf, Nb, Ta, Th, U, Ga, In, Sn, Co, Ni and Zn. These elements show no evidence of significant heterogeneity, indicating that the original glass constituents and possible residues remaining in the furnace from preceding glass batch fusions were well homogenised during manufacture.  相似文献   

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