Reduction of the phosphorus contamination for plasma deposition of p—i—n microcrystalline silicon solar cells in a single chamber     

王光红  张晓丹  许盛之  郑新霞  魏长春  孙建  熊绍珍  耿新华  赵颖 《海洋学报(英文版)》2010,29(9)

This paper investigates several pretreatment techniques used to reduce the phosphorus contamination between solar cells. They include hydrogen plasma pretreatment, deposition of a p-type doped layer, i-a-Si:H or μ c-Si:H covering layer between solar cells. Their effectiveness for the pretreatment is evaluated by means of phosphorus concentration in films, the dark conductivity of p-layer properties and cell performance.  相似文献   

Determination of internal wave properties from X-Band radar observations   总被引：2，自引：0，他引：2  

Rafael J. Ramos  Björn Lund  Hans C. Graber 《Ocean Engineering》2009,36(14):1039-1047

The application of nautical X-Band radars to measure internal wave (IW) properties is investigated. A methodology based on the use of Radon transform (RT) techniques to detect internal wave related features from backscatter image sequences is introduced to compute properties such as direction of propagation, non-linear velocity (c₀), distance between solitons (L_cc) and number of solitons per packet. The proposed methodology was applied to several events recorded by a ship-mounted X-Band radar system (WaMoS) during the NLIWI experiment in 2006. Results from the comparisons to simultaneous measurements taken at neighboring oceanographic moorings indicated that c₀ can be estimated with a RMS error of 0.06 m s⁻¹, which corresponds to a mean relative error of −1.4%. Similarly, L_cc can be estimated with a RMS error of 98 m, which is associated with a mean relative error of 14.6%. This latter error estimate however is likely to be overestimated, because it reflects strongly the separation between sampling stations as L_cc was shown to be highly dependent on propagation distance. The accuracy of the results shows that X-Band systems are well suited to measure internal wave properties offering some advantages over SAR and other in situ devices.  相似文献