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Semi-automatic approach toward mapping of flat-roofed buildings within a non-stereoscopic environment
Authors:Yair  Avrahami  Yuri  Raizman and Yerach  Doytsher
Institution:() Technion—Israel Institute of Technology, Haifa;, ()Survey of Israel;and ()Technion—Israel Institute of Technology, Haifa
Abstract:
Keywords:aerial images  building/roof extraction  digital photogrammetry  medium scale imagery  semi-automatic solution
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