Forty‐Nine Major and Trace Element Concentrations Measured in Soil Reference Materials NIST SRM 2586, 2587, 2709a, 2710a and 2711a Using ICP‐MS and Wavelength Dispersive‐XRF |
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| Authors: | Harris L Byers Lindsay J McHenry Timothy J Grundl |
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| Institution: | Department of Geosciences, University of Wisconsin–Milwaukee, Milwaukee, WI, USA |
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| Abstract: | Excellent agreement was noted in the concentration of major and trace elements in five NIST (National Institute for Science and Technology) soil reference materials (NIST SRM 2586, 2587, 2709a, 2710a and 2711a) between measurement results from wavelength dispersive‐XRF and ICP‐MS from two independent laboratories, and NIST certificate of analysis and literature data. We describe the variability in concentrations of up to forty‐nine elements (plus loss on ignition) and provide values for up to twenty‐one elements previously uncharacterised by NIST in these soil RMs. The additional characterisation provided in this investigation can be utilised to reduce the measurement bias of custom calibration routines and improve the quality of control checks developed using these NIST RMs. |
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| Keywords: | National Institute for Science and Technology inductively coupled plasma‐mass spectrometry wavelength‐dispersive X‐ray fluorescence WD‐XRF calibration materials soil urban agriculture Institut national de la science et de la technologie spectromé trie de masse couplé e à une torche à plasma fluorescence X et dispersion en longueur d'onde maté riaux d'é talonnage sol l'agriculture urbaine |
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