Wheat crop inventory using high spectral resolution irs-p3 mos-b spectrometer data |
| |
| Authors: | R P Singh V K Dadhwal R R Navalgund |
| |
| Institution: | 1. Remote Sensing Applications Area Space Applications Centre, 380053, Ahmedabad
|
| |
| Abstract: | Modular Optoelectronic Scanner (MOS-B) spectrometer data over parts of Northern India was evaluated for wheat crop monitoring involving (a) sub pixel wheat fractional area estimation using spectral unmixing approach and (b) growth assessment by red edge shift at different phenological stages. Red shift of 10 nm was observed between crown root initiation stage to flowering stage. Wheat fraction estimates using linear spectral unmixing on Feb. 13, 1999 acquisition of MOS-B data had high correlation (0.82) with estimates from Wide Field Sensor (WiFS) data acquired on same date by IRS-P3 platform. It was observed that five bands (4,5,8,12,13 MOS-B bands) are sufficient for signature separability of major land cover classes viz. wheat, urban, wasteland, and water based on purely spectral separability criterion using Transformed Divergence (T.D.) approach. Higher number of bands saturated the T.D. values. In contrast, performance of sub pixel fractional area estimation using unmixing decreased drastically for eight bands (4,5,6,7,8,9,12,13 MOS-B bands) chosen from optimal band selection criteria in comparison to full set of 13 bands. The relative deviation between area estimated from Wifs and MOS-B increased from 1.72 percent when all thirteen bands were used in unmixing to 26.10 percent for the above eight bands. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
