A focal plane detector design for a wide-band Laue-lens telescope |
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| Authors: | Ezio Caroli Natalia Auricchio Lorenzo Amati Yuriy Bezsmolnyy Carl Budtz-JøRgensen Rui M Curado da Silva Filippo Frontera Alessandro Pisa Stefano Del Sordo John B Stephen Giulio Ventura |
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| Institution: | (1) INAF/IASF-Bologna, Bologna, Italy;(2) Dipartimento di Fisica, Università di Ferrara, Ferrara, Italy;(3) Semiconductor Materials and Instruments Laboratory Ltd, Svitlovodsk, Ukraine;(4) Danish National Space Centre, Copenhagen, Denmark;(5) Departamento de Fisica, Universidade de Coimbra, Coimbra, Portugal;(6) INAF/IASF-Palermo, Palermo, Italy |
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| Abstract: | The energy range above 60 keV is important for the study of many open problems in high energy astrophysics such as the role of Inverse Compton with respect to synchrotron or thermal processes in GRBs, non thermal mechanisms in SNR, the study of the high energy cut-offs in AGN spectra, and the detection of nuclear and annihilation lines. Recently the development of high energy Laue lenses with broad energy bandpasses from 60 to 600keV have been proposed for a Hard X ray focusing Telescope (HAXTEL) in order to study the X-ray continuum of celestial sources. The required focal plane detector should have high detection efficiency over the entire operative range, a spatial resolution of about 1mm, an energy resolution of a few keV at 500keV and a sensitivity to linear polarization. We describe a possible configuration of the focal plane detector based on several CdTe/CZT pixelated layers stacked together to achieve the required detection efficiency at high energy.
Each layer can operate both as a separate position sensitive detector and polarimeter or work with other layers to increase the overall photopeak efficiency. Each layer has a hexagonal shape in order to minimize the detector surface required to cover the lens field of view. The pixels would have the same geometry so as to provide the best coupling with the lens point spread function and to increase the symmetry for polarimetric studies. |
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| Keywords: | Laue lens Hard X-ray Focal plane CZT |
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