The depth distribution of hydrogen in lunar materials |
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| Authors: | DA Leich TA Tombrello DS Burnett |
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| Institution: | California Institute of Technology, Pasadena, California 91109, USA |
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| Abstract: | A technique employing the resonant nuclear reaction 1H(19F, αγ) 16O has been used to measure hydrogen concentration versus depth in selected coarse fine fragments from the Apollo 11 and Apollo 15 missions, and in glass coated surface chips from two Apollo 15 rocks. The highly variable hydrogen content in the coarse fine fragments is concentrated mainly in a layer extending from the surface to a depth of 2000 ± 500A?. The hydrogen content of the surface region of the Apollo 15 rock chips is comparable to that of the coarse fine samples, but is concentrated mainly within a few hundred angstroms of the surface. The hydrogen depth distribution in a piece of platinum foil from the Apollo 16 Lunar surface Cosmic Ray Experiment was also measured in an attempt to place a limit on the flux of 10–40 keV protons associated with a solar flare event. |
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