Review on physical models of lunar brightness temperature |
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| Authors: | Jianqing Feng Yongliao Zou Wei Bian Yongchun Zheng Chunlai Li |
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| Institution: | (1) KR, Astromaterials Research Office, NASA Johnson Space Center, Houston, TX 77058, USA;(2) Planetary and Space Sciences Research Institute (PSSRI), The Open University, Walton Hall, Milton Keynes, MK7 6AA, UK;(3) EADS Astrium Ltd., Gunnels Wood Rd., Stevenage, SG1 2AS, UK |
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| Abstract: | Brightness temperature is a main index to reflect the energy of microwave radiation of an object. Using lunar brightness temperature data, physical properties of lunar regolith, such as thickness, heat flow and dielectric permittivity, could be interpreted. There are two methods to study brightness temperature distribution of the moon: the first is used to measure lunar brightness temperature by radio observation or spaceborne microwave radiometers, and the second is used to simulate calculation by the physical model. On the basis of the measurements of lunar brightness temperature in the history, this study analyzed the main physical model of lunar brightness temperature, also including its theory and influence factors. The authors concluded that surface and subsurface temperatures of the moon, dielectric properties and layered structure of lunar regolith were the main factors affecting the global brightness temperature of the moon. These factors should be quantified in detail in the future research. |
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| Keywords: | lunar regolith brightness temperature physical model moon |
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