首页 | 本学科首页   官方微博 | 高级检索  
     检索      


The effects of possible contamination by sample holders on samples to be returned by Hayabusa2
Authors:Naoki Shirai  Yuzuru Karouji  Kazuya Kumagai  Masayuki Uesugi  Kaori Hirahara  Motoo Ito  Naotaka Tomioka  Kentaro Uesugi  Akira Yamaguchi  Naoya Imae  Takuji Ohigashi  Toru Yada  Masanao Abe
Abstract:Chemical compositions of materials used for new sample holders (vertically aligned carbon nanotubes VACNTs] and polyimide film), which were developed for the analysis of Hayabusa2‐return samples, were determined by instrumental neutron activation analysis and/or instrumental photon activation analysis, to estimate contamination effects from the sample holders. The synthetic quartz plate used for the sample holders was also analyzed. Ten elements (Na, Al, Cr, Mn, Fe, Ni, Eu, W, Au, and Th) and 14 elements (Na, Al, K, Sc, Ti, Cr, Zn, Ga, Br, Sb, La, Eu, Ir, and Au) could be detected in the VACNTs and polyimide film, respectively. The VACNT data show that contamination by this material with respect to the Murchison meteorite is negligible in terms of the elemental ratios (e.g., Fe/Mn, Na/Al, and Mn/Cr) used for the classification of meteorites due to the extremely low density of VACNTs. However, for the Au/Cr ratio, even small degrees (1.7 wt%) of contamination by VACNTs will change the Au/Cr ratio. Elemental ratios used for the classification of meteorites are only influenced by large amounts of contamination (>60 wt%) of polyimide film, which is unlikely to occur. In contrast, detectable effects on Ti isotopic compositions are caused by >0.1 and >0.3 wt% contamination by VACNTs and polyimide film, respectively, and Hf isotopic changes are caused by >0.1 wt% contamination by VACNTs. The new sample holders (VACNTs and polyimide film) are suitable for chemical classification of Hayabusa2‐return samples, because of their ease of use, applicability to multiple analytical instruments, and low contamination levels for most elements.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号