首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Evaluation of Extensive Secondary Maximum Contaminant Level Exceedances Following Remediation by In Situ Chemical Oxidation
Authors:John P Herman  Thomas M Missimer
Abstract:In situ chemical oxidation (ISCO) with activated persulfate is commonly used for the remediation of petroleum impacted soil and groundwater because of its proven efficiency and the perception that reaction end products are completely innocuous. While the reaction products are less hazardous compared to the contaminants being treated, they may inadvertently prolong site closure in areas that have adopted the U.S. Environmental Protection Agency (EPA) Secondary Maximum Contaminant Levels (SMCLs) as enforceable standards. This study examines the occurrence and persistence of iron, manganese, sulfate, sodium, and total dissolved solids (TDS) in groundwater following persulfate ISCO. The concentrations of these chemicals were observed remaining above their respective regulatory criteria almost 3 years following the chemical application. Background concentrations and mobilization due to the petroleum contamination and ISCO application are also evaluated. Baseline sampling revealed substantially higher iron and manganese concentrations inside the plume area compared to the upgradient and downgradient wells suggesting mobilization due to redox reactions occurring inside of the plume. Iron was not a component in the applied chemical formula, yet the iron concentration spiked by 366% in the key monitoring well during the first post-remediation monitoring event. Ionic interactions between the ISCO amendment and native soils are believed to be responsible for displacing significant quantities of iron from the soil. Sulfate, sodium, and TDS exceedances are primarily associated with decomposition products of the ISCO amendments. The iron, manganese, sulfate, sodium, and TDS concentrations are trending downward over time, but still exceed regulatory criteria or pre-ISCO concentrations.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号