Transmission electron microscopy of experimentally deformed chalcopyrite single crystals |
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| Authors: | Jean-Jacques Couderc Christa Hennig-Michaeli |
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| Institution: | 1. Laboratoire de Physique des Solides, UPS et InSA, Avenue de Rangueil, F-31077, Toulouse Cedex, France
2. Institut für Mineralogie und Lagerst?ttenlehre, Rheinisch-Westf?lische Technische Hochschule, Wüllnerstr. 2, D-5100, Aachen, West Germany
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| Abstract: | Two crystals of natural chalcopyrite, CuFeS2, experimentally deformed at 200° C have been studied by means of transmission electron microscopy (TEM). The activated glide planes are (001) and {112}. The dislocations in (001) have the Burgers vector 110] and a predominating edge character. They are split into two colinear partials b=1/2110] and can cross split into {112}. The dislocations in {112} consist of straight segments along low index lattice lines. They are often arranged in dipoles generating trails of loops. Few dislocations with b=1/2 \(\overline {11} \) 1] and 1 \(\bar 1\) 0] are present and dislocations with b=0 \(\bar 2\) 1] occur in low angle subgrain boundaries. From weak beam contrasts it is presumed that most of the dislocations gliding in {112} have b=1/2〈3 \(\overline {11} \) 〉. They are dissociated into up to four partials. Microtwins and different types of stacking faults in {112} also occur. Models of the dissociation of dislocations are discussed. |
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