On the prognostics of growth profile based yield modelling |
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| Authors: | R P Dubey Tara Sharma |
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| Institution: | 1. Land Resources Division, Remote Sensing Applications Group, Space Applications Centre, 380 053, Ahmedabad
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| Abstract: | In order to improve the prognostics of yield forecasts two approaches have been explored using NDVI-based growth profiles for wheat crop of 1987-88 and 1990-91 seasons for some districts of Punjab and Haryana. Correlation of yield with variables based on profile area segments and with product of profile segment area and time to peak occurrence of growth cycle have been investigated. While the correlations are low and inconsistent for area variables, the îndex time product moment (IIPM) variable shows consistent and significant correlations and advances the date of forecast by 45-50 days over other approaches. |
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