CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests |
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| Authors: | Philippe Gouze Richard Leprovost Thierry Poidras Tanguy Le Borgne Gérard Lods Philippe A Pezard |
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| Institution: | 1. UMR 5243 CNRS, Géosciences Montpellier, université Montpellier-2, 34095 Montpellier cedex 5, France;2. UMR 6118, CNRS, Géosciences Rennes, campus de Beaulieu, université de Rennes-1, 35042 Rennes cedex, France |
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| Abstract: | Contaminant migration in aquifers is one of the most debated issues in hydrogeology, as most experimental results display large deviations from the standard (asymptotic) Fickian dispersion theories. Multi-scale investigation and high-resolution sensors are required to determine the origin of non-asymptotic dispersion and validate models. For this, a set of multi-scale Single-Well Injection-Withdrawal (SWIW) tracer tests using a new dual-packer probe CoFIS, including a high resolution optical sensor TELog, are presented. When compared to standard techniques such as salinity measurements, it is shown that high-resolution optical measurements allow an improved characterization of the long-lasting non-asymptotic dispersion mechanisms. |
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