Coincident seismic reflection/refraction studies of the continental lithosphere: a global review |
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| Authors: | Walter D Mooney Thomas M Brocher |
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| Institution: | U.S. Geological Survey, 345 Middlefield Rd., MS 977, Menlo Park. CA 94025 |
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| Abstract: | Summary. Vertical-incidence reflection profiling has identified several characteristic features of the continental Iithosphere including a generally transparent upper crust, a reflective lower crust, reflections from the crust-mantle boundary, and a commonly transparent upper mantle. The underlying physical causes of these characteristic features remain poorly understood. This review summarizes additional information brought to bear on the physical properties of these characteristic crustal structures through the use of coincident wide-angle refraction profiling. |
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