| 能量色散X射线荧光光谱法快速测定低品位精钼矿中杂相SiO2的含量 |
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| 引用本文： | 李哲,边明文.能量色散X射线荧光光谱法快速测定低品位精钼矿中杂相SiO2的含量[J].矿物学报,2009,29(1). |
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| 作者姓名： | 李哲 边明文 |
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| 作者单位： | 1. 中国矿业大学(北京),北京100083;黑龙江科技学院,黑龙江哈尔滨150027
2. 黑龙江科技学院,黑龙江哈尔滨,150027 |
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| 摘 要： | 用标准样品建立工作曲线,采用X射线荧光法测定低品位精钼矿中硅含量的方法及相关条件,并对测量结果精度进行分析。测定结果与国家标准方法的测定值相符,可满足日常分析工作需要。本方法具有样品前期处理简便、干扰因素小,且快速、准确等特点。
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| 关 键 词： | X-射线荧光光谱法 低品位精钼矿 硅 成分分析 |
DETERMINATION oF SiO2 IN THE LOW-GRADE MOLYBDENUM ORE BY ENERGY-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY |
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| LI Zhe,BIAN Ming-wen.DETERMINATION oF SiO2 IN THE LOW-GRADE MOLYBDENUM ORE BY ENERGY-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY[J].Acta Mineralogica Sinica,2009,29(1). |
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| Authors: | LI Zhe BIAN Ming-wen |
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| Abstract: | In this paper,a method of determining SiO2 in the low-grade fine molybdenum ore concentrates by energy-dispersive X-ray fluorescence spectrometry was studied.The calibration curves were made by using standard samples.The analytical results can be comparable with those obtained by the standard method GB/T15079-94.This method is suitable for routine control analysis.The method has the advantages of being simple,rapid,accurate and reproducible. |
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| Keywords: | X-Ray fluorescence spectrometry low-grade fine molybdenum ore silicon composition analysis |
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