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近地表反射和折射法的进展及应用
引用本文:刘江平,王莹莹,刘震,潘小康,宗育泉.近地表反射和折射法的进展及应用[J].地球物理学报,2015,58(9):3286-3305.
作者姓名:刘江平  王莹莹  刘震  潘小康  宗育泉
作者单位:中国地质大学(武汉)地球物理与空间信息学院, 武汉 430074
摘    要:针对近地表物质非均质极强、各向异性明显及地形复杂等特点,系统阐述和讨论了近地表折射和反射法的国内外研究与应用进展,认为:1综合利用纵、横波的优势,开展多波多分量联合勘探对提高浅层地震勘探的精度和分辨率具有重要作用;2现在的浅层地震勘探主要是对地震剖面进行解释,容易忽略一些隐含的地质异常现象,属性提取技术是充分提取地震信息,进行全面综合解释的有效手段;3开展多层折射介质的观测系统和解释方法研究,尤其是折射层析成像研究,是提高多层折射介质成像精度的途径;4开展黏弹性、双相和各向异性介质的地震反射与折射波法研究是提高近地表地震勘探成像和物性参数提取精度的新思路.

关 键 词:近地表  反射法  折射法  进展  应用  
收稿时间:2014-12-22

Progress and application of near-surface reflection and refraction method
LIU Jiang-Ping,WANG Ying-Ying,LIU Zhen,PAN Xiao-Kang,ZONG Yu-Quan.Progress and application of near-surface reflection and refraction method[J].Chinese Journal of Geophysics,2015,58(9):3286-3305.
Authors:LIU Jiang-Ping  WANG Ying-Ying  LIU Zhen  PAN Xiao-Kang  ZONG Yu-Quan
Institution:Institute of Geophysics and Geomatics, China University of Geosciences, Wuhan 430074, China
Abstract:According to the strong heterogeneity, obvious anisotropy and complex terrain features of near-surface material, this paper systematically expounds and discusses the research and application progress of near-surface refraction and reflection method in domestic and abroad, finding that: taking advantage of P-wave and S-wave, and carrying out multi-wave and three-component exploration is important to improve the accuracy and resolution of shallow seismic exploration; the shallow seismic exploration interpretation now is mainly based on seismic profile, so it is easy to overlook some hidden geological anomalies, while attribute extraction technology is an effective means to fully get seismic information and conduct comprehensive interpretations; carrying out research on observing system and interpretation method of multilayer refraction media, especially refraction tomography, is an effective way to improve imaging precision of multilayer refraction media; studying seismic reflection and refraction method based on viscoelastic, two-phase and anisotropic media is an new idea to improve the accuracy of near-surface seismic imaging and physical parameters extraction.
Keywords:Near-surface  Reflection method  Refraction method  Progress  Application
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