Characterization of interface roughness of rippled sand off Fort Walton Beach, Florida |
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| Authors: | Briggs KB Dajun Tang Williams KL |
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| Institution: | Seafloor Sci. Branch, Naval Res. Labora, Stennis, MS; |
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| Abstract: | As part of the environmental characterization to model acoustic bottom scattering during the high-frequency sediment acoustics experiment (SAX99), fine-scale sediment roughness of a medium sand was successfully measured within a 600 /spl times/ 600-m area by two methods: stereo photography and a technique using a conductivity system. Areal coverage of the two methods, representing approximately 0.16 m/sup 2/ of the sea floor, was comparable, resulting in the depiction and quantification of half-meter wavelength sand ripples. Photogrammetric results were restricted to profiles digitized at 1-mm intervals; sediment conductivity results generated gridded micro-bathymetric measurements with 1- to 2-cm node spacing. Roughness power spectra give similar results in the low-spatial-frequency domains where the spectra estimated from both approaches overlap. However, spectra derived from higher resolution photogrammetric results appear to exhibit a multiple-power-law fit. Roughness measurements also indicate that spectrum changes as a function of time. Application of statistical confidence bounds on the power spectra indicates that roughness measurements separated by only 1-2 m may be spatially nonstationary. |
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