| Abstract: | Diffractions not only carry important information about small-scale subsurface structures, they also possess unique properties, which make them a powerful tool for seismic processing and imaging. Since a point diffractor scatters an incoming wave to all directions, a diffraction event implies better illumination than a reflection, because the rays travel through larger parts of the subsurface. Furthermore, unlike the reflection case, in which the emergence location of the reflected wave depends on the source position, in the case of non-Snell scattering, up-going and down-going raypaths are decoupled. Based on this decoupling, we introduce a diffraction traveltime decomposition principle, which establishes a direct connection between zero-offset and finite-offset diffraction wavefield attributes. By making use of this approach, we are able to enhance diffractions and obtain high-quality diffraction wavefield attributes at arbitrary offsets in the prestack domain solely based on zero-offset processing without any further optimization of attributes. We show the accuracy of the method by fitting diffraction traveltimes, and on simple waveform data. Application to complex synthetic data shows the ability of the proposed approach to enhance diffractions and provide high-quality wavefield attributes even in sparsely illuminated regions such as subsalt areas. The promising results reveal a high potential for improved prestack data enhancement and further applications such as efficient diffraction-based finite-offset tomography. |
