| 电子探针分析技术进展及面临的挑战 |
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| 引用本文： | 张迪,陈意,毛骞,苏斌,贾丽辉,郭顺.电子探针分析技术进展及面临的挑战[J].岩石学报,2019,35(1):261-274. |
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| 作者姓名： | 张迪 陈意 毛骞 苏斌 贾丽辉 郭顺 |
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| 作者单位： | 中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029,中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029;中国科学院青藏高原地球科学卓越创新中心, 北京 100101,中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029,中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029,中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029,中国科学院地质与地球物理研究所岩石圈演化国家重点实验室, 北京 100029;中国科学院青藏高原地球科学卓越创新中心, 北京 100101 |
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| 基金项目： | 本文受国家重点研发计划项目（2016YFE0203000）和国家自然科学基金项目（41490614）联合资助. |
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| 摘 要： | 电子探针是研究地球与行星物质组成最基础的微束分析技术。近年来,固体地球科学和行星科学的不断发展,促使电子探针分析技术取得了一系列进展:矿物微量元素分析、稀土矿物测试方法完善、副矿物定年、富Fe矿物/熔体Fe~(3+)含量测定、场发射电子探针及软X射线分析谱仪的开发及应用等。同时,电子探针分析技术也面临着诸多挑战:微量元素测试在降低检测限的同时,还需要提高分析的准确度和精确度;降低二次荧光效应的影响;场发射电子探针在低电压下需要建立全新的分析条件和校正方式。基于这些挑战,电子探针未来在微量元素监测标样开发、二次荧光效应校正、场发射电子探针及软X射线分析谱仪应用、波谱仪完善和微区多种分析技术集成等方面具有发展潜力,以便为地学样品的研究提供更丰富、更准确的微米尺度成分信息。
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| 关 键 词： | 微量元素分析 副矿物定年 场发射电子探针 软X射线分析谱仪 二次荧光效应 |
| 收稿时间： | 2018/7/30 0:00:00 |
| 修稿时间： | 2018/10/20 0:00:00 |
Progress and challenge of electron probe microanalysis technique |
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| ZHANG Di,CHEN Yi,MAO Qian,SU Bin,JIA LiHui and GUO Shun.Progress and challenge of electron probe microanalysis technique[J].Acta Petrologica Sinica,2019,35(1):261-274. |
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| Authors: | ZHANG Di CHEN Yi MAO Qian SU Bin JIA LiHui and GUO Shun |
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| Institution: | State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China,State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China;CAS Center for Excellence in Tibetan Plateau Earth Sciences, Beijing 100101, China,State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China,State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China,State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China and State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Science, Beijing 100029, China;CAS Center for Excellence in Tibetan Plateau Earth Sciences, Beijing 100101, China |
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| Abstract: | Electron probe microanalysis (EPMA) is a fundamental analysis technique for the study of the Earth and planets materials. In the last decades, EPMA has been developed from its essential capacity of analyzing major elements for minerals to a series of innovative technologies, including trace-element analyses in crucial minerals, precise analysis of rare-earth minerals, chemical dating of accessory minerals, Fe3+ determination in Fe-rich minerals, and applications of field-emission gun EPMA (FEG-EPMA) and soft X-ray emission spectrometer (SXES). However, there are still many challenges in such innovative technologies as follows:(1) how to lower detection limit and improve the precision and accuracy; (2) how to eliminate the influence of the secondary fluorescence effect; (3) establishing new analytical and correction methods under low accelerating voltage conditions by using FEG-EPMA. EPMA analyses are expected to have great potentials involving the development of reference standards, secondary fluorescence effect correction, broad applications of FEG-EPMA and soft X-ray emission spectrometer, improvement of spectrometer and integration of multiple microbeam techniques. Therefore, EPMA would provide further abundant and accurate micron-scale information for geological samples. |
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| Keywords: | Trace element analysis Accessory mineral dating Field emission electron probe microanalyzer Soft X-ray emission spectrometer Secondary fluorescence effect |
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