| 铀M系X射线的分析应用 |
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| 引用本文： | 张鸿文,甘璇玑.铀M系X射线的分析应用[J].铀矿地质,1985(2). |
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| 作者姓名： | 张鸿文 甘璇玑 |
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| 摘 要： | 本文采用薄膜法制样,然后进行铀的X射线荧光分析。使用铀的M系线比用L系线有以下优点:分辨率较高,灵敏度较高,本底低很多,蜂背比高,检测限(Cr靶,PE晶体,100秒计数)可达0.01ppm。
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| 关 键 词： | 铀 X射线 分析 |
THE APPLICATION OF URANIUM M LINES IN XRF METHOD FOR URANIUM ANALYSIS |
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| Zhang Hongwen Gang Xuanji.THE APPLICATION OF URANIUM M LINES IN XRF METHOD FOR URANIUM ANALYSIS[J].Uranium Geology,1985(2). |
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| Authors: | Zhang Hongwen Gang Xuanji |
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| Institution: | Zhang Hongwen Gang Xuanji |
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| Abstract: | The preparation of thin film specimen and XRF method for uranium is described in this paper. The application of uranium M lines in XRF has advantage oyer correspanding L lines. The former has higher resolution, higher sensitivitys than the latter. Moreover the former has much lower background and higher ratio of peak to background. The detection limit(Cr target, PE crystal, 100 sec counting time) is 0.01 ppm. |
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| Keywords: | Uranium X-ray Analysis |
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