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利用AMSR-E数据反演华北平原冬小麦单散射反照率
引用本文:柴琳娜,吴凤敏,张立新,施建成.利用AMSR-E数据反演华北平原冬小麦单散射反照率[J].遥感学报,2015,19(1):153-171.
作者姓名:柴琳娜  吴凤敏  张立新  施建成
作者单位:北京师范大学遥感科学国家重点实验室, 遥感与地理信息系统研究中心, 地理学与遥感科学学院, 北京 100875;北京师范大学遥感科学国家重点实验室, 遥感与地理信息系统研究中心, 地理学与遥感科学学院, 北京 100875;重庆市地理信息中心, 重庆 401121;北京师范大学遥感科学国家重点实验室, 遥感与地理信息系统研究中心, 地理学与遥感科学学院, 北京 100875;中国科学院遥感与数字地球研究所 遥感科学国家重点实验室, 北京 100101
基金项目:国家自然科学基金(编号:41171259);国家重点基础研究发展计划(973计划)(编号:2013CB733406)
摘    要:首先,基于冬小麦不同生育期的地面实测参数,构建了组成冬小麦冠层的、包括不同尺寸和含水量的介电散射体模拟数据库,并在此基础上建立冬小麦单散射反照率和光学厚度分别在C(6.925 GHz)和X(10.65 GHz)波段之间的依赖关系。然后,根据一阶参数化模型推导得到的微波植被指数MVIs(Microwave Vegetation Indices)的物理表达式,结合AMSR-E被动微波亮温数据,反演了华北平原地区冬小麦不同生育期的单散射反照率。与MODIS日归一化差异植被指数NDVI的对比结果显示:冬小麦单散射反照率与NDVI随时间的变化趋势大致相同,但在冬小麦的抽穗期到乳熟期,NDVI呈现饱和趋势,而单散射反照率对小麦的生长变化仍旧比较敏感,在指示冬小麦生长方面具有一定优势。

关 键 词:单散射反照率  冬小麦  AMSR-E  参数化模型  微波植被指数  被动微波
收稿时间:2013/8/13 0:00:00
修稿时间:2014/2/5 0:00:00

Estimating single scattering albedo of winter wheat over the North China Plain using AMSR-E data
CHAI Linn,WU Fengmin,ZHANG Lixin and SHI Jiancheng.Estimating single scattering albedo of winter wheat over the North China Plain using AMSR-E data[J].Journal of Remote Sensing,2015,19(1):153-171.
Authors:CHAI Linn  WU Fengmin  ZHANG Lixin and SHI Jiancheng
Institution:State Key Laboratory of Remote Sensing Science, Research Center for Remote Sensing and GIS, and School of Geography, Beijing Normal University, Beijing 100875, China;State Key Laboratory of Remote Sensing Science, Research Center for Remote Sensing and GIS, and School of Geography, Beijing Normal University, Beijing 100875, China;Chongqing Geomatics Center, Chongqing 401121, China;State Key Laboratory of Remote Sensing Science, Research Center for Remote Sensing and GIS, and School of Geography, Beijing Normal University, Beijing 100875, China;State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing and Digital Earth, Chinese Academy of Sciences, Beijing 100101, China
Abstract:We proposed a method to estimate single scattering albedo of winter wheat over the North China Plain with AMSR-E passive microwave imagery. The relationships of single scattering albedo and optical depth between 6.925 GHz and 10.65 GHz were derived from simulations. To retrieve the single scattering albedo, the relationships were combined with the physical expressions of microwave vegetation indices derived from the first-order parameterized emission model. Comparisons with normalized difference vegetation index (NDVI) obtained from daily MODIS reflectance product showed that the variations in winter wheat single scattering albedo were similar to those of winter wheat NDVI. However, several differences were observed. NDVI showed saturation from the heading stage to the milky stage of winter wheat, whereas single scattering albedo remained sensitive to the growth of winter wheat. Single scattering albedo offers certain advantages in reflecting the growth status of winter wheat.
Keywords:single scattering albedo  winter wheat  AMSR-E  parameterized model  microwave vegetation indices  passive microwave
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