New ID-TIMS, ICP-MS and SIMS Data on the Trace Element Composition and Homogeneity of NIST Certified Reference Material SRM 610-611 |
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| Authors: | Alexander Rocholl Peter Dulski Ingrid Raczek |
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| Institution: | Mineralogisches Institut, Universitt Heidelberg, INF 236, D-69120 Heidelberg, Germany;GeoForschungsZentrum Potsdam, Telegrafenberg, D-14473 Potsdam, Germany;Max-Planck-Institut fr Chemie, Postfach 3060, D-55020 Mainz, Germany |
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| Abstract: | We present new concentration data for twenty four lithophile trace elements in NIST certified reference material glasses SRM 610-SRM 611 in support of their use in microanalytical techniques. The data were obtained by solution ICP-MS and isotope dilution TIMS analysis of two different sample wafers. An overall assessment of these new results, also taking into account ion probe studies that have been published in the literature, shows that these wafers can be considered to be homogeneous. Therefore, individually analysed wafers are believed to be representative of the entire batch of the SRM 610-611 glasses. Possible exceptions are the alkali metals (and a few volatile or non-lithophile trace elements). The analysed concentrations range between 370 μg g?1 (Cs) and 500 μg g?1 (Sr) and agree well with published values. On the basis of our new data and data recently published in the literature we propose "preferred average" values for the elements studied. These values are, within a few percent, identical to those proposed by other workers. |
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| Keywords: | NIST SRM 610-611 trace elements homogeneity microprobe techniques reference materials |
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