The effect of impedance contrast upon surface motion due to scattering of plane harmonic P, SV, and Rayleigh waves by a randomly corrugated elastic inclusion |
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| Authors: | M Dravinski M C Yu |
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| Institution: | 1. USC Viterbi School of Engineering, University of Southern California, Los Angeles, CA, 90089-1453, USA
2. L-3 Communications, 10770 Wateridge Circle, Suite 200, San Diego, CA, 92121, USA
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| Abstract: | Scattering of a plane harmonic P, SV, or Rayleigh wave by a corrugated elastic inclusion completely embedded in a two-dimensional isotropic half space is investigated by using a direct boundary integral equation method. The corrugated scatterer is generated by superimposing a random perturbation of arbitrary amplitude to a smooth elliptical shape. The probability density function for the randomly corrugated inclusions is assumed to be of uniform or normal types. The displacement fields are evaluated along the half-space surface for a range of impedance contrasts, frequencies, five incident waves for circular- and elliptic-based rough inclusions. Subsequently, the roughness factor is introduced in terms of the surface response for the rough and the corresponding smooth inclusions. The results clearly show that this factor strongly depends upon the impedance contrast of the materials, the basic inclusion geometry, the type of incident wave, and the frequency. The peak values of the roughness factor are observed for the near-grazing SV incidence. Furthermore, the impedance contrast of the materials has a non-uniform effect upon the surface motion. While the smallest roughness factor is consistently observed for the minimal impedance contrast the peak values of the same factor may take place for different non-minimal impedance contrasts. For the range of frequencies considered here, the type of the random interface corrugation (random-uniform vs. random-normal) has a minimal effect upon the roughness factor. |
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