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Analog circuit to simulate dynamic soil–structure interaction in shake table test
Authors:Kazuo Konagai  Toyoaki Nogami
Institution:aInstitute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan;bDepartment of Civil and Environmental Engineering, University of Cincinnati, Cincinnati, OH 45221, USA
Abstract:A soil medium at the side of an embedded structure is treated as mutually uncoupled horizontal layers of a unit thickness. A plane strain condition is assumed within each individual layer such that the medium responses do not vary along the thickness. According to previous work by the authors and also a new formulation given herein, the impedance of the above layer at the structure can be produced by frequency-independent simple mechanical models for all three modes of foundation responses. Similar frequency-independent models are also presented for the impedance at the foundation base. These models are made of two different basic elements and a mass interconnected in series. Their arrangements directly indicate the wiring of electric circuits which generate signals corresponding to the transient soil–structure interaction responses. To all intents and purposes, electric circuits do not loose time in responding to the inputs. Therefore, they allow us to simulate the soil–structure interaction response in shake table model tests, which are commonly conducted at relatively high excitation frequencies for earthquake simulation.
Keywords:soil&ndash  structure interaction  time-domain analysis  equivalent electric circuit
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