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Crustal thickness and VP/VS variations in the Grenville orogen (Ontario, Canada) from analysis of teleseismic receiver functions
Authors:David W Eaton  Savka Dineva  Robert Mereu
Institution:aDepartment of Earth Sciences, University of Western Ontario, London, Ontario, Canada N6A 5B7
Abstract:We have developed a simple semblance-weighted stacking technique to estimate crustal thickness and average VP/VS ratio using teleseismic receiver functions. We have applied our method to data from 32 broadband seismograph stations that cover a 700 × 400 km2 region of the Grenville orogen, a 1.2–0.98 Ga Himalayan-scale collisional belt in eastern North America. Our seismograph network partly overlaps with Lithoprobe and other crustal refraction surveys. In 8 out of 9 cases where a crustal-refraction profile passes within 30 km of a seismograph station, the two independent crustal thickness estimates agree to within 7%. Our regional crustal-thickness model, constructed using both teleseismic and refraction observations, ranges between 34.0 and 52.4 km. Crustal-thickness trends show a strong correlation with geological belts, but do not correlate with surface topography and are far in excess of relief required to maintain local isostatic equilibrium. The thickest crust (52.4 ± 1.7 km) was found at a station located within the 1.1 Ga mid-continent (failed) rift. The Central Gneiss Belt, which contains rocks exhumed from deep levels of the crust, is characterized by VP/VS ranging from 1.78 to 1.85. In other parts of the Grenville orogen, VP/VS is found to be generally less than 1.80. The thinnest crust (34.5–37.0 km) occurs northeast of the 0.7 Ga Ottawa–Bonnechere graben and correlates with areas of high intraplate seismicity.
Keywords:Grenville orogen  Crustal thickness  VP/VS ratio  Teleseismic receiver functions
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