首页 | 本学科首页   官方微博 | 高级检索  
     检索      


A systematic method for the analysis of high-resolution fraunhofer line profiles
Authors:C De Jager  L Neven
Institution:(1) University Observatory lsquoSonnenborghrsquo, Utrecht, The Netherlands;(2) Royal Belgian Observatory, Uccle-Brussels, Belgium
Abstract:A fraunhofer line profile depends on various parameters, partly related to the photospheric structure (T, P g, P e, v conv, v turb), partly to the atom or ion involved (such as oscillator strength, energy levels), partly also resulting from the interaction of the relevant kind of particles with the photosphere, and the photospheric radiation field. In this paper we shall mainly pay attention to the determination of: the macroturbulent (convective) velocities, v conv (tau); the damping constant gamma (tau); the abundance, A el; the distribution function phiv(v conv, tau) of the convective velocities at each depth tau; the source function, S (tau); the microturbulent velocities, v turb (tau).The particular difficulty with these unknowns is that they are, as a rule, coupled in the resulting line profiles, that is: the shapes and intensities in these profiles are determined by the combined influence of these unknowns (together with the other above-given parameters).In this paper we describe a method to determine these six unknowns empirically by separating them, in analysing accurate high-resolution observations of line profiles of a multiplet. The unknown functions and quantities are consecutively determined in the above given succession. For each determination another, appropriate part of the line profile is used. In some cases the influence of the mutual coupling of the various parameters cannot be completely eliminated, and an iterative method has to be used.The method is summarized in Table II and section 2, and is further explained in sections 3 to 8. It is applied to an infrared Ci multiplet. The main results are the following:
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号