| 利用观测的TEC和电离图推导顶部电离层剖面的一个方法 |
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| 引用本文： | 吴健,龙其利,王新法.利用观测的TEC和电离图推导顶部电离层剖面的一个方法[J].地球物理学报,1996,39(Z1):18-26. |
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| 作者姓名： | 吴健 龙其利 王新法 |
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| 作者单位： | 中国电波传播研究所, 河南新乡 453003 |
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| 摘 要： | 给出一个利用观测的ＴＥＣ和电离图参数来推导顶部电离层电子密度剖面的方法．基本原理是，利用反演的峰下剖面计算出峰下积分电子含量，然后由观测的ＴＥＣ推算出顶部的积分电子含量。假定ＩＲＩ计算的顶部剖面经一个修正标高因子修正后所得的积分电子含量与观测值一致，从而得到修正标高因子。
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| 关 键 词： | 顶部电离层 电子密度剖面 国际参考电离层 总电子含量 |
| 收稿时间： | 1995-09-15 |
A METHOD FOR DEDUCING THE TOPSIDE IONOSPHERIC PROFILE FROM IONOGRAMS AND TEC MEASUREMENTS |
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| WU JIAN,LONG QI-LI,WANG XIN-FA.A METHOD FOR DEDUCING THE TOPSIDE IONOSPHERIC PROFILE FROM IONOGRAMS AND TEC MEASUREMENTS[J].Chinese Journal of Geophysics,1996,39(Z1):18-26. |
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| Authors: | WU JIAN LONG QI-LI WANG XIN-FA |
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| Institution: | China Research Institute of Radiowave Propagation, Xingxiang 453003, China |
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| Abstract: | A method is presented in this paper for deducing the topside ionospheric electron concentration profile from THC measurements and ionograms obtained by ionosonds, in which the calculated profile by IRI─90 is corrected by a supposed scale height to fit the actual topside profile. Such a correcting scale height is obtained by forcing the integration of the corrected topside profile equal to the measured topside electron content, which is obtained with measured TEC eliminating the sub-peak electron content, an integration of the sub-peak electron concentration profile deduced from ionograms. |
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| Keywords: | Topside ionosphere Electron concentration profile International reference ionosphere Total electron content |
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