| LA-(MC)-ICPMS和(Nano)SIMS硫化物微量元素和硫同位素原位分析与矿床形成的精细过程 |
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| 引用本文： | 范宏瑞,李兴辉,左亚彬,陈蕾,刘尚,胡芳芳,冯凯.LA-(MC)-ICPMS和(Nano)SIMS硫化物微量元素和硫同位素原位分析与矿床形成的精细过程[J].岩石学报,2018,34(12):3479-3496. |
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| 作者姓名： | 范宏瑞 李兴辉 左亚彬 陈蕾 刘尚 胡芳芳 冯凯 |
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| 作者单位： | 中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049;中国科学院地球科学研究院, 北京 100029,中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049,中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049,岩石圈演化国家重点实验室, 中国科学院地质与地球物理研究所, 北京 100029,中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049,中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049;中国科学院地球科学研究院, 北京 100029,中国科学院矿产资源研究重点实验室, 中国科学院地质与地球物理研究所, 北京 100029;中国科学院大学地球与行星科学学院, 北京 100049 |
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| 基金项目： | 本文受国家重点研发计划项目（2016YFE0203000）和国家自然科学基金项目（41672094）联合资助. |
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| 摘 要： | 硫化物微区原位分析技术包括LA-ICPMS定点微量元素分析、LA-ICPMS和(Nano) SIMS微量元素面扫描分析,以及SIMS、Nano SIMS和LA-MC-ICPMS原位硫同位素点分析和面扫描。这些分析方法可以有效地获取不同期次硫化物微量元素含量、丰度分布图像、硫同位素比值和分布特征,结合微区时间分辨信号谱图、微量元素相关性分析等,在矿床学的成矿元素行为与赋存状态、成矿元素置换反应、成矿流体与硫的来源、矿石矿物的化学分带性、矿床成因模型等研究中有着重要的应用前景,以探讨矿床的精细成矿过程。硫化物原位微量元素和同位素LA-(MC)-ICPMS和(Nano) SIMS分析,需要降低仪器和分析方法的系统误差,克服严重的基体效应和同位素分馏效应。
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| 关 键 词： | LA-(MC)-ICPMS (Nano)SIMS 微量元素 硫同位素 硫化物 成矿过程 金属矿床 |
| 收稿时间： | 2018/2/5 0:00:00 |
| 修稿时间： | 2018/7/10 0:00:00 |
In-situ LA-(MC)-ICPMS and (Nano)SIMS trace elements and sulfur isotope analyses on sulfides and application to confine metallogenic process of ore deposit |
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| FAN HongRui,LI XingHui,ZUO YaBin,CHEN Lei,LIU Shang,HU FangFang and FENG Kai.In-situ LA-(MC)-ICPMS and (Nano)SIMS trace elements and sulfur isotope analyses on sulfides and application to confine metallogenic process of ore deposit[J].Acta Petrologica Sinica,2018,34(12):3479-3496. |
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| Authors: | FAN HongRui LI XingHui ZUO YaBin CHEN Lei LIU Shang HU FangFang and FENG Kai |
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| Institution: | Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;Institutions of Earth Science, Chinese Academy of Sciences, Beijing 100029, China,Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China,Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China,State Key Laboratory of Lithospheric Evolution, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China,Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China,Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;Institutions of Earth Science, Chinese Academy of Sciences, Beijing 100029, China and Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing 100029, China;College of Earth and Planetary Sciences, University of Chinese Academy of Sciences, Beijing 100049, China |
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| Abstract: | In-situ micro-analyses on sulfides currently include LA-ICPMS spot analysis, LA-ICPMS and (Nano)SIMS mapping of trace elements, in-situ sulfur isotope spot analysis and mapping by SIMS, NanoSIMS, as well as LA-MC-ICPMS. Those analytical methods can effectively obtain the contents and abundance maps of trace elements, sulfur isotopic ratios and distribution in sulfides at different stages, which combined with time-resolved spectra data and analysis of trace element correlations have significant implications on the research of fine metallogenic process. The analytical results are essential for the understanding of the behavior and occurrence of metallogenic elements, element substitution, source of ore-forming fluids and sulfur, chemical banding of ore mineral and genetic model of ore deposit. During in-situ trace elemental and isotopic analyses on sulfides by LA-ICPMS, LA-MC-ICPMS, SIMS and NanoSIMS, it is necessary to reduce the systematic error of instrument and analytical method, and overcome the potential matrix effect and isotope fractionation. |
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| Keywords: | LA-(MC)-ICPMS (Nano)SIMS Trace element Sulfur isotope Sulfide Metallogenic process Ore deposit |
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