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X射线荧光光谱法测定多目标地球化学调查样品中主次痕量组分
引用本文:张勤,樊守忠,潘宴山,李国会.X射线荧光光谱法测定多目标地球化学调查样品中主次痕量组分[J].岩矿测试,2004,23(1):19-24.
作者姓名:张勤  樊守忠  潘宴山  李国会
作者单位:中国地质科学院地球物理地球化学勘查技术研究所,河北,廊坊,065000
基金项目:国土资源部地质大调查项目(DKD9904017)
摘    要:采用低压聚乙烯镶边垫底的粉末样品压片制样,用PW2440X射线荧光光谱仪对多目标地球化学调查样品中Na2O、MgO、Al2O3、SiO2、P、K2O、CaO、Ti、Mn、Fe2O3、Co、Nb、Zr、Y、Sr、Rb、Pb、Th、Zn、Cu、Ni、V、Cr、Ba、La等组分进行测定。重点讨论了微量元素的背景选择和谱线重叠校正问题。使用经验系数法和康普顿散射线作内标校正基体效应,经标准物质分析检验,结果与标准值吻合,用GBW07308和GBW07310水系沉积物国家一级标准物质作精密度试验,统计结果RSD(n=12)除La、Cr、Co和Th<14.00%以外,其余各组分均小于6.00%。

关 键 词:化探样品  X射线荧光光谱仪  背景位置选择  谱线重叠校正  粉末样品压片
文章编号:0254-5357(2004)01-0019-06
修稿时间:2003年3月10日

Determination of 25 Major, Minor and Trace Elements in Geochemical Exploration Samples by X-Ray Fluorescence Spectrometry
ZHANG Qin,FAN Shou-zhong,PAN Yan-shan,LI Guo-hui.Determination of 25 Major, Minor and Trace Elements in Geochemical Exploration Samples by X-Ray Fluorescence Spectrometry[J].Rock and Mineral Analysis,2004,23(1):19-24.
Authors:ZHANG Qin  FAN Shou-zhong  PAN Yan-shan  LI Guo-hui
Abstract:A method for direct determination of Na_(2)O, MgO, Al_(2)O_(3), SiO_(2), P, K_(2)O, CaO, Ti, V, Cr, Mn,( Fe_2O_3,) Co, Ni, Cu, Pb, Zn, Nb, Zr, Y, Sr, Rb, Th, Ba and La in geochemical exploration samples by XRF with sample preparation of pressed powder pellets was developed. The interference from background and spectra overlap was discussed. The matrix effect was corrected by experience coefficients and using scattered radiation as internal standard (for trace elements). The accuracy of the method was evaluated by analysis of certified reference materials of GBW 07301a, GBW 07317 and GBW 07423. The results are in agreement with certified values with precision of less than 6.0% RSD (n=12) expect for La, Cr, Co and Th (RSD<14.00%).
Keywords:geochemical exploration sample  PW2440 X-ray fluorescence spectrometer  selected background position  spectra overlap correction  pressed powder pellet
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