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应用微束分析技术研究铜钴矿床中钴的赋存状态
引用本文:涂家润,卢宜冠,孙凯,周红英,郭虎,崔玉荣,耿建珍,李国占.应用微束分析技术研究铜钴矿床中钴的赋存状态[J].岩矿测试,2022(2):226-238.
作者姓名:涂家润  卢宜冠  孙凯  周红英  郭虎  崔玉荣  耿建珍  李国占
作者单位:中国地质调查局天津地质调查中心, 天津 300170;中国地质调查局华北地质科技创新中心, 天津 300170;中国地质调查局天津地质调查中心, 天津 300170;中国地质调查局华北地质科技创新中心, 天津 300170;中国地质调查局东部南部非洲地学合作研究中心, 天津 300170
基金项目:国家自然科学基金项目(42103025,41873066,42073055);中国地质调查局地质调查项目(DD20190439,DD20221801)
摘    要:微束分析技术能够在微米-纳米尺度上精确分析矿石矿物的物相、形貌、结构、成分以及同位素组成,为地球科学精细研究提供重要技术支撑。本文利用多种微束分析技术的自身优势,综合运用微区X射线荧光光谱(micro-XRF)、偏光显微镜、电子探针(EPMA)以及激光剥蚀电感耦合等离子体质谱(LA-ICP-MS)分析技术,建立了一种简单直观且全面快速鉴别钴赋存状态的技术方法。首先采用偏光显微镜选出部分代表性的探针片,然后进行微区X射线荧光光谱面扫描,获得探针片中钴及组合元素分布规律及特征,再利用偏光显微镜细致观察鉴别,结合元素分布特征规律识别出独立钴矿物以及含钴矿物,最后圈出代表性矿物并采用电子探针和LA-ICP-MS进行主微量化学成分测定。将该方法应用于中非铜钴成矿带上典型铜钴矿床中钴的赋存状态研究,查明了谦比希东南矿体中的钴主要以独立矿物(钴镍黄铁矿、硫钴矿、硫铜钴矿)和类质同象(主要赋存于黄铁矿、磁黄铁矿中)两种形式存在,而谦比希西矿体中的钴主要以独立矿物——硫铜钴矿的形式零星存在。

关 键 词:微束分析  赋存状态  铜钴矿床  面扫描  微区X射线荧光光谱法  激光剥蚀电感耦合等离子体质谱法
收稿时间:2021/12/6 0:00:00
修稿时间:2022/1/8 0:00:00

Application of Microbeam Analytical Technology to Study the Occurrence of Cobalt from Copper-Cobalt Deposits
TU Jiarun,LU Yiguan,SUN Kai,ZHOU Hongying,GUO Hu,CUI Yurong,GENG Jianzhen,LI Guozhan.Application of Microbeam Analytical Technology to Study the Occurrence of Cobalt from Copper-Cobalt Deposits[J].Rock and Mineral Analysis,2022(2):226-238.
Authors:TU Jiarun  LU Yiguan  SUN Kai  ZHOU Hongying  GUO Hu  CUI Yurong  GENG Jianzhen  LI Guozhan
Institution:Tianjin Center, China Geological Survey, Tianjin 300170, China;North China Center for Geoscience Innovation, China Geological Survey, Tianjin 300170, China;Tianjin Center, China Geological Survey, Tianjin 300170, China;North China Center for Geoscience Innovation, China Geological Survey, Tianjin 300170, China;Eastern and Southern Africa Geosciences Cooperation Research Center, China Geological Survey, Tianjin 300170, China
Abstract:BACKGROUND: Microbeam analytical technology can be used to accurately analyze the petrography, morphology, structure, component and isotopic composition of ore minerals on the micro-nano scale, which plays a vital role in supporting the detailed research of geoscience.OBJECTIVES: To provide a practical technology for visually and quickly identifying the cobalt-bearing minerals and to understand the occurrence of cobalt in the Chambishi copper-cobalt deposit.METHODS: Microscopy was combined with microbeam analytical technologies of micro-XRF, EPMA, LA-ICP-MS to develop a method for quickly identifying the cobalt-bearing minerals from copper-cobalt deposits. First, representative thin sections were selected by polarized light microscopy, micro-XRF map scanning was then used to obtain the distribution characteristics of cobalt and combined elements in the thin sections. The polarized light microscopy was used again to identify independent cobalt minerals and cobalt-bearing minerals based on the characteristics of element distribution. Finally, the representative minerals were circled and the main and trace elements were determined by EPMA and LA-ICP-MS.RESULTS: The results showed that in the Chambishi Southeast orebody the cobalt not only existed in the form of independent minerals (pentlandite, linnaeite, carrollite), but also occurred in pyrite and pyrrhotite in the form of isomorphism, while the cobalt in the Chambishi West orebody mainly existed in the form of independent mineral-carrollite with a small amount.CONCLUSIONS: The combined microbeam analysis method is proposed to quickly and easily identify cobalt-bearing minerals and to study the occurrence of cobalt in the Chambishi Southeast orebody and Chambishi West orebody. It can effectively save the time of identifying minerals by traditional polarized light microscopy and avoid missing identification of some independent cobalt minerals or cobalt-bearing minerals with small particle size or without obvious optical characteristics.
Keywords:microbeam analysis  occurrence state  copper-cobalt deposits  mapping  micro-XRF  LA-ICP-MS
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