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木兰山蓝片岩中斜黝帘石—低铁绿帘石连生体的确定
引用本文:赵文俞,牟善斌,等.木兰山蓝片岩中斜黝帘石—低铁绿帘石连生体的确定[J].岩矿测试,2002,21(1):29-32.
作者姓名:赵文俞  牟善斌
作者单位:1. 武汉理工大学材料研究与测试中心,武汉理工大学材料复合新技术,国家重点实验室,湖北,武汉,430070
2. 武汉理工大学材料研究与测试中心,湖北,武汉,430070
3. 武汉理工大学材料复合新技术,国家重点实验室,湖北,武汉,430070
基金项目:国家自然科学基金资助项目 (4 980 2 0 0 4)
摘    要:电子探针和光学显微镜联合分析表明,木兰山蓝片岩中存在斜黝帘石-低铁绿帘石连生体。界面区Fe、Al元素的线扫描曲线研究表明,(Fe,Al)类质同象替代为连生体界面共晶膜的形成机制。木兰山蓝片岩中斜黝帘石-低铁绿帘石连生体的确定,说明电子探针和光学显微镜联合分析可有效确定光学性质和化学成分均相近的微细粒连生体的组成矿物,其结果对认识木兰山蓝片岩的变质演化具有指示意义。

关 键 词:蓝片岩  斜黝帘石  低铁绿帘石  连生体  界面形成机制  电子探针  光学显微镜
文章编号:0254-5357(2002)01-0029-04
修稿时间:2001年1月16日

Determination of Fine Intergrowth of Low-Fe Epidote and Clinoepidote in the Glaucophane Schist from Mulan Mountain by Electron Probe Microanalysis and Optical Microscopy
ZHAO Wen yu,MOU Shan bin,QIN Lin qing,ZHANG Qing jie.Determination of Fine Intergrowth of Low-Fe Epidote and Clinoepidote in the Glaucophane Schist from Mulan Mountain by Electron Probe Microanalysis and Optical Microscopy[J].Rock and Mineral Analysis,2002,21(1):29-32.
Authors:ZHAO Wen yu  MOU Shan bin  QIN Lin qing  ZHANG Qing jie
Institution:ZHAO Wen yu 1,2,MOU Shan bin 1,QIN Lin qing 1,ZHANG Qing jie 2
Abstract:The existence of fine intergrowth of low Fe epidote and clinoepidote in the glaucophane schist from Mulan Mountain, Hubei province has been confirmed by the analytical data from electron probe microanalysis (EPMA) and optical microscopic (OM) analysis. Interfacial analysis of the intergrowth shows that eutectic film on the interfacial area between low Fe epidote and clinoepidote has been formed by (Fe, Al) isomorphic replacement. The evidences from the study have proved that EPMA combined with OM provides a comprehensive research method to identify the fine intergrowths composed of the minerals with similar optical character and chemical composition. The conclusion in the paper contributes to the understanding of metamorphic evolution of the glaucophane schist in Mulan Mountain.
Keywords:glaucophane schist  clinoepidote  low  Fe epidote  intergrowth  mechanism of interface formation  electron probe microanalysis (EPMA)  optical microscopy (OM)
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