| 飞行时间二次离子质谱(TOF-SIMS)在矿物包裹体研究中的应用 |
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| 引用本文： | 王梦琴,蔡克大,李展平.飞行时间二次离子质谱(TOF-SIMS)在矿物包裹体研究中的应用[J].岩石矿物学杂志,2023,42(3):451-464. |
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| 作者姓名： | 王梦琴 蔡克大 李展平 |
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| 作者单位： | 中国地质大学 地球科学与资源学院, 地质过程与矿产资源国家重点实验室, 北京 100083;清华大学 化学系, 有机光电子与分子工程教育部重点实验室, 北京 100084 |
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| 基金项目： | 国家重点研发计划课题 (2018YFA0702600) |
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| 摘 要： | 矿物包裹体的化学成分研究在地质学、矿床学和油气勘探等方面具有重要意义。目前对包裹体化学成分分析的主要分析方法有激光烧蚀电感耦合等离子体质谱(LA-ICP-MS)、电子探针(EPMA)、显微激光拉曼光谱(LRS)、傅里叶变换红外光谱(FTIR)、质子诱发X射线光谱分析(PIXE)、同步辐射X射线荧光光谱(SXRF)和(传统的)二次离子质谱分析(SIMS)等。本文在对上述方法的分析特点进行简单介绍的基础上，重点阐述了对于矿床学样品表征具有广泛应用潜力的飞行时间二次离子质谱(TOF-SIMS)的原理、特点和技术优势，总结了国内外学者应用TOF-SIMS对矿物包裹体化学成分分析的研究进展与存在问题，并做了相关领域的展望。
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| 关 键 词： | 矿物包裹体 TOF-SIMS 表面分析 |
| 收稿时间： | 2022/11/26 0:00:00 |
| 修稿时间： | 2023/3/10 0:00:00 |
Application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) in the study of mineral inclusions |
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| WANG Meng-qin,CAI Ke-d,LI Zhan-ping.Application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) in the study of mineral inclusions[J].Acta Petrologica Et Mineralogica,2023,42(3):451-464. |
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| Authors: | WANG Meng-qin CAI Ke-d LI Zhan-ping |
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| Institution: | School of Earth Sciences Resources, State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Beijing 100083, China; Department of Chemistry, Key Laboratory of Organic Optoelectronics and Molecular Engineering of Ministry of Education, Tsinghua University, Beijing 100084, China |
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| Abstract: | The study of the chemical composition of mineral inclusions is of great significance in geology, mineralogy, and hydrocarbon exploration. The main methods currently investigated for the analysis of the chemical composition of inclusions are laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), electron probe microanalysis (EPMA), laser Raman spectroscopy (LRS), Fourier transform infrared spectroscopy (FTIR), proton-induced X-ray emission spectroscopy (PIXE), synchrotron X-ray fluorescence spectroscopy (SXRF) and (conventional) secondary ion mass spectrometry (SIMS), etc. This paper briefly introduces the analytical characteristics of the above methods, focuses on the principles, characteristics, and technical advantages of time-of-flight secondary ion mass spectrometry (TOF-SIMS), which has wide potential for the characterization of mineralogical samples, and summarizes the progress and problems of the application of TOF-SIMS for the analysis of the chemical composition of mineral inclusions by domestic and foreign scholars, and gives an outlook on related fields. |
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| Keywords: | mineral inclusion TOF-SIMS surface analysis |
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