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叶腊石微结构及其晶体结构缺陷的高分辨透射电镜分析
引用本文:严俊,张俭,胡仙超,姚程,方伟,盛嘉伟.叶腊石微结构及其晶体结构缺陷的高分辨透射电镜分析[J].矿物学报,2012,32(1):65-73.
作者姓名:严俊  张俭  胡仙超  姚程  方伟  盛嘉伟
作者单位:浙江工业大学化学工程与材料学院,浙江杭州,310014
基金项目:浙江省科技厅重大主题专项项目,浙江省研究生教育创新基金
摘    要:采用场发射扫描电镜(FE-SEM)、高分辨透射电镜(HRTEM)结合选区电子衍射(SAED)、X射线粉晶衍射(XRD)及X射线荧光光谱(XRF)等对浙江青田叶腊石的微结构特征进行较系统的研究。结果表明:①粉晶X射线衍射证实青田叶腊石具有典型的单斜晶系特征,该结论与叶腊石粉体选区电子衍射结果吻合,且其伴生矿为石英。②叶腊石微晶体呈"复式板片"构型,且"复式"板片中薄片厚度约为8±2 nm。③在高能电子束辐照下,叶腊石矿物颗粒形貌及晶格结构发生明显的改变,且由此产生晶格膨胀,并最终形成非晶态。

关 键 词:叶腊石  微结构  扫描电镜  高分辨透射电镜  选区电子衍射

Determination of Microstructure and Defect Structure in Pyrophyllite by High-Resolution Transmission Electron Microscopy
YAN Jun,ZHANG Jian,HU Xian-chao,YAO Cheng,FANG Wei,SHENG Jia-wei.Determination of Microstructure and Defect Structure in Pyrophyllite by High-Resolution Transmission Electron Microscopy[J].Acta Mineralogica Sinica,2012,32(1):65-73.
Authors:YAN Jun  ZHANG Jian  HU Xian-chao  YAO Cheng  FANG Wei  SHENG Jia-wei
Institution:(College of Chemical Engineering and Materials Science,Zhejiang University of Technology,Hangzhou,Zhejiang 310014,China)
Abstract:The microstructure characterizations of pyrophyllite were investigated by using field emission scanning electron microscopy(FE-SEM),high-resolution transmission electron microscopy(HRTEM) coupled with selected area electron diffraction(SAED),X-ray diffraction(XRD) and X-ray Fluorescence(XRF).The following results are obtained:(1) Major constituents of natural mineral from Qingtian pyrophyllite deposit are pyrophyllite and quartz,and the 2M-pyrophylite is corroborated well.(2) A complex laminal structure of the micro-crystal of pyrophyllite is found,and the thickness of flake microstructure is 8±2 nm.(3) High energy electron beam irradiation induces morphology of clay mineral particles and lattice structure change,and it results in lattice dilatation and transformation from crystalline to amorphous finally.
Keywords:pyrophyllite  microstructure  SEM  HRTEM  SAED
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