Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting |
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| Authors: | Nynke Keulen Mark T Hutchison Dirk Frei |
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| Institution: | Geological Survey of Denmark and Greenland (GEUS), Øster Voldgade 10, 1350 Copenhagen K, Denmark |
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| Abstract: | Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe. |
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| Keywords: | Kimberlite indicator mineral Computer-controlled SEM Ilmenite Olivine Garnet Analytical technique |
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