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A Potential New Chalcopyrite Reference Material for Secondary Ion Mass Spectrometry Sulfur Isotope Ratio Analysis
Authors:Rucao Li  Xiao‐Ping Xia  Huayong Chen  Nanping Wu  Taiping Zhao  Chunkit Lai  Qing Yang  Yanqiang Zhang
Abstract:Chalcopyrite is an important sulfide mineral in many types of ore deposits, but matrix‐matched chalcopyrite reference materials for microanalysis are lacking. A new natural chalcopyrite‐bearing specimen (HTS4‐6) was analysed in this study to investigate its potential as a reference material for microbeam sulfur isotope ratio measurement. Detailed textural examination and major element determination showed that the HTS4‐6 chalcopyrite grains have no growth rim or zoning. A total of 607 sulfur isotope ratio spot measurements with secondary ion mass spectrometry (SIMS) conducted on the cruciform sections, and over 120 randomly selected grains yielded highly consistent sulfur isotope ratio. The intermediate measurement precision for four measurement sessions of the 34S/32S measurement results was better than 0.39‰ (2s). Randomly selected chalcopyrite grains of HTS4‐6 were further analysed by LA‐MC‐ICP‐MS, which gave a mean δ34S value of +0.58 ± 0.38‰ (2s, n = 95). The maximum variance (expressed as intermediate precision from SIMS and LA‐MC‐ICP‐MS measurements) is not worse than 0.39‰ (the SIMS value), indicating that HTS4‐6 chalcopyrite is a potential reference material for in situ microbeam sulfur isotope measurements. The mean δ34S value determined by gas source isotope ratio mass spectrometry (GS‐IRMS) is +0.63 ± 0.16‰ (2s, n = 23), consistent with that derived by LA‐MC‐ICP‐MS, and can represent the recommended value for this potential reference material.
Keywords:chalcopyrite  reference material  HTS4‐6  sulfur isotopes  secondary ion mass spectrometry  SIMS
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