Electron Probe Microanalysis of Bromine in Minerals and Glasses with Correction for Spectral Interference from Aluminium,and Comparison with Microbeam Synchrotron X‐Ray Fluorescence Spectrometry |
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| Authors: | Chao Zhang Jinru Lin Yuanming Pan Renfei Feng Renat R Almeev Francois Holtz |
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| Institution: | 1. Institute of Mineralogy, Leibniz Universit?t Hannover, Hannover, Germany;2. Department of Geological Sciences, University of Saskatchewan, Saskatoon, Saskatchewan, Canada;3. Canadian Light Source, University of Saskatchewan, Saskatoon, Saskatchewan, Canada |
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| Abstract: | The strong spectral interference between Br‐ and Al‐induced X‐ray lines hampers the utilisation of electron probe microanalysis (EPMA) for measuring Br mass fractions in Al‐bearing minerals and glasses. Through measuring Br‐free Al‐bearing materials, we established an EPMA method to quantify the overlap from AlKα on BrLβ, which can be expressed as a linear function of the Al2O3 content. The count rate of the BrLβ peak signal was enhanced by high beam currents and long measurement times. Application of this EPMA method to Al‐ and Br‐bearing materials, such as sodalite and scapolite, and to five experimental glasses yielded Br mass fractions (in the range of 250–4000 μg g?1) that are consistent with those measured by microbeam synchrotron X‐ray fluorescence (μ‐SXRF) spectrometry. The EPMA method has an estimated detection limit of ~ 100–300 μg g?1. We propose that this method is useful for measuring Br mass fractions (hundreds to thousands of μg g?1) in Al‐bearing minerals and glasses, including those produced in Br‐doped experiments. In addition, the natural marialitic scapolite (ON70) from Mpwapwa (Tanzania) containing homogeneously distributed high mass fractions of Br (2058 ± 56 μg g?1) and Cl (1.98 ± 0.03% m/m) is an ideal reference material for future in situ analyses. |
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| Keywords: | electron probe microanalysis synchrotron X‐ray fluorescence spectrometry bromine aluminium interference |
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