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Analytical Developments in Secondary Ion Mass Spectrometry 2003
Authors:Etienne Deloule  Michael Wiedenbeck
Institution:CRPG-CNRS, 15 rue Notre-Dame des Pauvres, BP 20, 54501 Vandoeuvre-lès-Nancy, France e-mail:;GeoForschungsZentrum, Telegrafenberg, D14473 Potsdam, Germany e-mail:
Abstract:This annual review of secondary ion mass spectrometry (SIMS) highlights significant progress in the application of the technology for the following areas: U-Pb geochronology (notably in the fields of reference material zircons), sources of uncertainty during analysis and secondary ion yields. Major publications introduced a new zircon reference sample and dealt with an intercomparison study of a suite of established calibrators, some of which have been shown to have certain limitations. Another publication claimed that the principal uncertainty in U-Pb dating is related to variations in the Pb and U relative emission yields over a complete analytical session. 2003 saw the introduction of an automated particle identification procedure applied to the analysis of a chondritic meteorite, as well as new geometries of SIMS hardware (NanoSIMS) and techniques (time-of-flight SIMS). NanoSIMS allows a two to three order of magnitude reduction in sampling volume as a result of a reduced beam diameter, and time-of-flight SIMS allows the study of sample surfaces, and can provide data for elements concurrently.
Keywords:review  secondary ion mass spectrometry  geochronology  U-Pb  zircon  reference samples  NanoSIMS  time-of-flight SIMS
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