Conditional Simulation with Patterns |
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| Authors: | G Burc Arpat and Jef Caers |
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| Institution: | (1) Department of Energy Resources Engineering, Stanford University, Stanford, CA 94305-2220, USA |
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| Abstract: | An entirely new approach to stochastic simulation is proposed through the direct simulation of patterns. Unlike pixel-based
(single grid cells) or object-based stochastic simulation, pattern-based simulation simulates by pasting patterns directly
onto the simulation grid. A pattern is a multi-pixel configuration identifying a meaningful entity (a puzzle piece) of the
underlying spatial continuity. The methodology relies on the use of a training image from which the pattern set (database)
is extracted. The use of training images is not new. The concept of a training image is extensively used in simulating Markov
random fields or for sequentially simulating structures using multiple-point statistics. Both these approaches rely on extracting
statistics from the training image, then reproducing these statistics in multiple stochastic realizations, at the same time
conditioning to any available data. The proposed approach does not rely, explicitly, on either a statistical or probabilistic
methodology. Instead, a sequential simulation method is proposed that borrows heavily from the pattern recognition literature
and simulates by pasting at each visited location along a random path a pattern that is compatible with the available local
data and any previously simulated patterns. This paper discusses the various implementation details to accomplish this idea.
Several 2D illustrative as well as realistic and complex 3D examples are presented to showcase the versatility of the proposed
algorithm. |
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| Keywords: | Geostatistics pattern similarity multiple-point statistics |
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