| XRF半定量分析技术在矿石光片鉴定中的应用 |
| |
| 引用本文： | 范鹏飞,邓述培,邹源,刘朝,翟宏宇,周冬冬.XRF半定量分析技术在矿石光片鉴定中的应用[J].吉林大学学报(地球科学版),2021,51(3):783-791. |
| |
| 作者姓名： | 范鹏飞 邓述培 邹源 刘朝 翟宏宇 周冬冬 |
| |
| 作者单位： | 1. 东华理工大学地球科学学院, 南昌 330006;2. 核工业二三○研究所, 长沙 410007;3. 湖南省有色地质勘查研究院测试中心, 长沙 410000;4. 湖南省地质调查院, 长沙 410116;5. 中国建筑材料工业地质勘查中心湖南总队, 长沙 410000 |
| |
| 基金项目： | 中国地质调查局项目（DD20190379-17）；中国核工业集团有限公司项目（地LCEQ-KYWX-01）；中国核工业地质局项目（201918） |
| |
| 摘 要： | 偏光显微镜反光镜下鉴定金属矿物是最常用、最快捷有效的方法，然而鉴定结果容易受到鉴定者主观因素或磨片情况的影响。为了更快速、准确地在反光镜下鉴定矿物，利用XRF半定量分析技术快速、无损、前处理简单等特点，以及磨平抛光的矿石矿物在半定量分析过程中能较好地避免楔入效应和阴影效应的有利因素，采取了先用XRF半定量分析测得的结果去反推矿物，再在显微镜下鉴定矿物的方法。以多金属硫化物矿石、含铀多金属矿石及含微量铀的矿石样品为例进行鉴定，结果表明，在鉴定前知道光片上的元素及其质量分数，通过地球化学方法和经验法反推矿物，结合显微镜观察需要鉴定的矿物，可有效避免忽略掉透明/半透明矿物（锡石）、小粒径矿物（沥青铀矿）、易混淆矿物（铀黑），提高光片鉴定工作的效率和准确性。
|
| 关 键 词： | XRF 半定量分析 矿石光片 鉴定 |
| 收稿时间： | 2020-05-07 |
Application of XRF Semi-Quantitative Analysis Technology in Identifying Ore on Polished Section |
| |
| Fan Pengfei,Deng Shupei,Zou Yuan,Liu Chao,Zhai Hongyu,Zhou Dongdong.Application of XRF Semi-Quantitative Analysis Technology in Identifying Ore on Polished Section[J].Journal of Jilin Unviersity:Earth Science Edition,2021,51(3):783-791. |
| |
| Authors: | Fan Pengfei Deng Shupei Zou Yuan Liu Chao Zhai Hongyu Zhou Dongdong |
| |
| Institution: | 1. School of Earth Science, East China University of Technology, Nanchang 330006, China;2. Nuclear Research Institue of No. 230, Changsha 410007, China;3. Hunan Nonferrous Metal Exploration and Research Institute Testing Center, Changsha 410000, China;4. Hunan Institue of Geology Survey, Changsha 410116, China;5. Hunan Branch of China National Geological Exploration Center of Building Materials Industry, Changsha 410000, China |
| |
| Abstract: | The identification of minerals under the reflective polarizing microscope is the most commonly used, quickest, and effective method. However, the identification results are easily affected by personal subjective factors and conditions of the polished section. If we know the elements in the polished section in advance and relative content, we can conjecture the minerals based on geochemical methods and experiences, and the composition data combined with microscope observation can greatly improve the efficiency and accuracy of polished section identification. XRF semi-quantitative analysis technology has the characteristics of fast, non-destructive and simple in sample preparation. In the process of semi-quantitative analysis of the polished section, wedging and shadow effects can be avoided; although the gangue minerals such as silicate minerals cannot be avoided, and there may be even some other influencing factors such as chemical bond drift, the identification of gangue minerals is not very important. Using the results of XRF semi-quantitative analysis to conjecture the minerals, and then identify the minerals under a microscope, the efficiency and accuracy of polished section identification can be improved significantly. In order to illustrate the specific application of XRF semi-quantitative analysis technology in identification of polished section, several examples of polished section identification of polymetallic sulfide ores and uranium-containing polymetallic ores are listed. |
| |
| Keywords: | XRF semi-quantitative analysis ore polished section identification |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
| 点击此处可从《吉林大学学报(地球科学版)》浏览原始摘要信息 |
| 点击此处可从《吉林大学学报(地球科学版)》下载免费的PDF全文 |
|
