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A new method for the estimation of oceanic mixed-layer depth using shipboard X-band radar images |
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| Authors: | Haibin Lü Yijun He Hui Shen Limin Cui Chang’e Dou |
| Institution: | 1. Institute of Oceanology, Chinese Academy of Sciences, Qingdao, 266071, China 2. Key Laboratory of Ocean Circulation and Wave, CAS, Qingdao, 266071, China 3. Graduate University of the Chinese Academy of Sciences, Beijing, 100039, China 4. School of Geodesy & Geomatics Engineering, Huaihai Institute of Technology, Lianyungang, 222005, China |
| Abstract: | Shipboard X-band radar images acquired on 24 June 2009 are used to study nonlinear internal wave characteristics in the northeastern South China Sea. The studied images show three nonlinear internal waves in a packet. A method based on the Radon Transform technique is introduced to calculate internal wave parameters such as the direction of propagation and internal wave velocity from backscatter images. Assuming that the ocean is a two-layer finite depth system, we can derive the mixed-layer depth by applying the internal wave velocity to the mixed-layer depth formula. Results show reasonably good agreement with in-situ thermistor chain and conductivity-temperature-depth data sets. |
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