A primary analysis of microwave brightness temperature of lunar surface from Chang-E 1 multi-channel radiometer observation and inversion of regolith layer thickness |
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| Authors: | Wenzhe Fa |
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| Institution: | Key Laboratory of Wave Scattering and Remote Sensing Information (MoE), Fudan University, Shanghai 200433, China |
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| Abstract: | In China’s first lunar exploration project, Chang-E 1 (CE-1), a multi-channel microwave radiometer was aboard the satellite, with the purpose of measuring microwave brightness temperature (Tb) from lunar surface and surveying the global distribution of lunar regolith layer thickness. In this paper, the primary 621 tracks of swath data measured by CE-1 microwave radiometer from November 2007 to February 2008 are collected and analyzed. Using the nearest neighbor interpolation to collect the Tb data under the same Sun illumination, global distributions of microwave brightness temperature from lunar surface at lunar daytime and nighttime are constructed. Based on the three-layer media modeling (the top dust-soil, regolith and underlying rock media) for microwave thermal emission of lunar surface, the CE-1 measured Tb and its dependence upon latitude, frequency and FeO + TiO2 content, etc. are discussed. The CE-1 Tb data at Apollo landing sites are especially chosen for validation and calibration on the basis of available ground measurements. Using the empirical dependence of physical temperature upon the latitude verified by the CE-1 multi-channel Tb data at Apollo landing sites, the global distribution of regolith layer thickness is further inverted from the CE-1 brightness temperature data at 3 GHz channel. Those inversions at Apollo landing sites and the characteristics of regolith layer thickness for lunar maria are well compared with the Apollo in situ measurements and the regolith thickness derived from the Earth-based radar data. Finally, the statistical distribution of regolith thickness is analyzed and discussed. |
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