The study on mechanism and model of negative bias temperature instability degradation in P-channel metal—oxide—semiconductor field-effect transistors     

曹艳荣  马晓华  郝跃  田文超 《海洋学报(英文版)》2010,29(9)

Negative Bias Temperature Instability (NBTI) has become one of the most serious reliability problems of metal--oxide--semiconductor field-effect transistors (MOSFETs). The degradation mechanism and model of NBTI are studied in this paper. From the experimental results, the exponential value 0.25--0.5 which represents the relation of NBTI degradation and stress time is obtained. Based on the experimental results and existing model, the reaction--diffusion model with H ⁺ related species generated is deduced, and the exponent 0.5 is obtained. The results suggest that there should be H ⁺ generated in the NBTI degradation. With the real time method, the degradation with an exponent 0.5 appears clearly in drain current shift during the first seconds of stress and then verifies that H⁺ generated during NBTI stress.  相似文献   

白露山隧洞通顶大塌方的处理方法          下载免费PDF全文

田文超 《探矿工程》1993,(2):58-58

我队曾经在施工某金矿区时布置了2个短浅坑道，总工作量为300m。岩层主要为燧石灰岩，扁豆状灰岩，硅质岩和炭质泥岩等。该矿区地处偏辟，交通不便，决定采用轻便的YO-18型凿岩机组进行施工，取得了满意的效果。  相似文献